Abstract

We present a compact stand-alone near-field optical microscope combined with force detection in which manufactured atomic force microscope (AFM) microcantilevers are used for both optical and force detection. Because of the stand-alone design, the combination allows a great variety of operation modes, including the scanning tunneling optical microscope (STOM), and possibly the reflection scanning near-field optical microscope modes. The first images obtained in the AFM and the STOM mode are presented. A polarization study is carried out to confirm the optical nature of the detected signal and to discuss possible artifacts.

© 1998 Optical Society of America

Full Article  |  PDF Article

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (8)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription