Abstract

We have developed new, highly absorptive coatings for the vacuum UV wavelength range. These coatings display two distinct granularity scales: large structures of a 10–100-μm scale form efficient light traps, upon which are superimposed structures of a submicrometer scale. We present results for the total hemispherical reflectivity at normal incidence for 121.6 nm and at a grazing angle incidence for 17.1, 30.4, 58.4, and 121.6 nm. These measurements were made for the new coatings as well as for various coatings in common use. Absorption of the new coatings is in some cases higher than for the best-known coatings and, in contrast to the latter, they are mechanically robust.

© 1998 Optical Society of America

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References

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  1. T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
    [CrossRef]
  2. P. Jelinsky, S. Jelinsky, “Low reflectance EUV materials—a comparative study,” Appl. Opt. 26, 613–620 (1987).
    [CrossRef] [PubMed]
  3. J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.
  4. K. A. Moldosanov, M. A. Samsonov, L. S. Kim, E. A. Kornev, V. Yu. Krasnichenko, A. L. Yascovich, M. N. Pavlinsky, “Low reflectivity coating in EUV,” Preprint No. 1880 (Space Research Institute of Russian Academy of Sciences, Moscow, 1993).
  5. K. A. Moldosanov, M. A. Samsonov, L. S. Kim, “Optical element,” Russian Patent93057999 (1993).
  6. M. A. Samsonov, K. A. Moldosanov, L. S. Kim, “Method of fabrication of optical elements,” Russian patent93058000 (1993).
  7. C. C. Blatchley, E. A. Johnson, “Rugged dark materials for stray light suppression by seeded ion texturing,” in Stray Radiation in Optical Systems II, R. P. Breault, ed., Proc. SPIE1753, 317–326 (1992).
    [CrossRef]
  8. C. M. Egert, D. D. Allred, “Diffuse absorbing beryllium coatings produced by magnetron sputtering,” in Stray Radiation in Optical Systems, R. P. Breault, ed., Proc. SPIE1331, 170–178 (1990).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  12. Y. A. Makarova, A. V. Kharitonov, T. V. Kazachevskaya, Solar Radiation Flux (Nauka, Moscow, 1991).
  13. M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
    [CrossRef]
  14. D. L. Windt, W. C. Cash, M. Scott, P. Arendt, B. Newman, R. F. Fisher, A. B. Swartzlander, P. Z. Takacs, J. M. Pinneo, “Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 Å to 1216 Å,” Appl. Opt. 27, 279–295 (1988);D. L. Windt, W. C. Cash, M. Scott, P. Arendt, B. Newman, R. F. Fisher, A. B. Swartzlander, “Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 Å to 1216 Å,” Appl. Opt. 27, 246–278 (1988).
    [CrossRef] [PubMed]
  15. J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
    [CrossRef]
  16. R Henneck, A. I. Cherepanov, H Feldhaus, G. A. Koptsov, A. V. Koshevnikov, V. P. Krivobokov, V. N. Legostayev, K. A. Moldosanov, B. K. Sadybakasov, N. A. Timchenko, “Low reflectivity materials for the VUV,” proposal to the “International Association for the Promotion of Cooperation with Scientists from the New Independent States of the Former Soviet Union” (INTAS Call 96), 58 avenue des Arts, box 8, B-1000 Brussels, Belgium.

1997 (1)

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

1995 (1)

T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
[CrossRef]

1988 (1)

1987 (1)

1978 (1)

L. Heroux, H. E. Hinteregger, “Aeronomical reference spectrum for solar UV below 2000 Å,” J. Geophys. Res. 83, 5305–5308 (1978).
[CrossRef]

1965 (1)

Allred, D. D.

C. M. Egert, D. D. Allred, “Diffuse absorbing beryllium coatings produced by magnetron sputtering,” in Stray Radiation in Optical Systems, R. P. Breault, ed., Proc. SPIE1331, 170–178 (1990).
[CrossRef]

Arendt, P.

Bialkowski, J

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Bialkowski, J.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

Blatchley, C. C.

C. C. Blatchley, E. A. Johnson, “Rugged dark materials for stray light suppression by seeded ion texturing,” in Stray Radiation in Optical Systems II, R. P. Breault, ed., Proc. SPIE1753, 317–326 (1992).
[CrossRef]

Bochsler, P.

T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
[CrossRef]

Bühler, P.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

Carone, T.

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Cash, W. C.

Courvoisier, T.

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Cully, S. L.

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

Edgar, M. L.

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

Egert, C. M.

C. M. Egert, D. D. Allred, “Diffuse absorbing beryllium coatings produced by magnetron sputtering,” in Stray Radiation in Optical Systems, R. P. Breault, ed., Proc. SPIE1331, 170–178 (1990).
[CrossRef]

Fisher, R. F.

Güdel, M.

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Henneck, R.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Heroux, L.

L. Heroux, H. E. Hinteregger, “Aeronomical reference spectrum for solar UV below 2000 Å,” J. Geophys. Res. 83, 5305–5308 (1978).
[CrossRef]

Hinteregger, H. E.

L. Heroux, H. E. Hinteregger, “Aeronomical reference spectrum for solar UV below 2000 Å,” J. Geophys. Res. 83, 5305–5308 (1978).
[CrossRef]

Jelinsky, P.

P. Jelinsky, S. Jelinsky, “Low reflectance EUV materials—a comparative study,” Appl. Opt. 26, 613–620 (1987).
[CrossRef] [PubMed]

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

Jelinsky, S.

P. Jelinsky, S. Jelinsky, “Low reflectance EUV materials—a comparative study,” Appl. Opt. 26, 613–620 (1987).
[CrossRef] [PubMed]

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

Johnson, E. A.

C. C. Blatchley, E. A. Johnson, “Rugged dark materials for stray light suppression by seeded ion texturing,” in Stray Radiation in Optical Systems II, R. P. Breault, ed., Proc. SPIE1753, 317–326 (1992).
[CrossRef]

Kazachevskaya, T. V.

Y. A. Makarova, A. V. Kharitonov, T. V. Kazachevskaya, Solar Radiation Flux (Nauka, Moscow, 1991).

Kharitonov, A. V.

Y. A. Makarova, A. V. Kharitonov, T. V. Kazachevskaya, Solar Radiation Flux (Nauka, Moscow, 1991).

Makarova, Y. A.

Y. A. Makarova, A. V. Kharitonov, T. V. Kazachevskaya, Solar Radiation Flux (Nauka, Moscow, 1991).

Martini, R.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Mchedlishvili, A.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Newman, B.

Nicodemus, F. E.

Pinneo, J. M.

Schlumpf, N.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Schoeps, W.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

Scholze, F.

T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
[CrossRef]

Scott, M.

Siegmund, O. H. W.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Swartzlander, A. B.

Takacs, P. Z.

Warren, J. K.

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

Welsh, B.

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Windt, D. L.

Zehnder, A.

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

Zurbuchen, T.

T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
[CrossRef]

Appl. Opt. (3)

J. Geophys. Res. (1)

L. Heroux, H. E. Hinteregger, “Aeronomical reference spectrum for solar UV below 2000 Å,” J. Geophys. Res. 83, 5305–5308 (1978).
[CrossRef]

Nucl. Instrum. Methods A (1)

J. Bialkowski, P. Bühler, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, W. Schoeps, A. Zehnder, O. H. W. Siegmund, “EUVID—a compact, high-resolution imaging detector for the wavelength range 20 ≤ λ ≤ 1200 Å,” Nucl. Instrum. Methods A 386, 280–294 (1997).
[CrossRef]

Opt. Eng. (1)

T. Zurbuchen, P. Bochsler, F. Scholze, “Reflection of UV light at 121.6 nm from rough surfaces,” Opt. Eng. 34, 1303–1315 (1995).
[CrossRef]

Other (10)

R Henneck, A. I. Cherepanov, H Feldhaus, G. A. Koptsov, A. V. Koshevnikov, V. P. Krivobokov, V. N. Legostayev, K. A. Moldosanov, B. K. Sadybakasov, N. A. Timchenko, “Low reflectivity materials for the VUV,” proposal to the “International Association for the Promotion of Cooperation with Scientists from the New Independent States of the Former Soviet Union” (INTAS Call 96), 58 avenue des Arts, box 8, B-1000 Brussels, Belgium.

Y. A. Makarova, A. V. Kharitonov, T. V. Kazachevskaya, Solar Radiation Flux (Nauka, Moscow, 1991).

M. L. Edgar, S. L. Cully, S. Jelinsky, P. Jelinsky, O. H. W. Siegmund, J. K. Warren, “Soft x-ray to FUV measurements of the grazing incidence BRDF for a selection of low-reflectivity surfaces,” in EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII,O. H. Siegmund, M. A. Gummin, eds., Proc. SPIE2808, 313–324 (1996).
[CrossRef]

J Bialkowski, M. Güdel, R. Henneck, R. Martini, A. Mchedlishvili, N. Schlumpf, A. Zehnder, T. Courvoisier, T. Carone, O. H. W. Siegmund, B. Welsh, “FUVITA—a far UV imaging telescope on the Spectrum X-Gamma Satellite,” Ann. Report (Paul-Scherrer-Institut, Villigen, Switzerland, 1994), Section 3A, p. 110.

K. A. Moldosanov, M. A. Samsonov, L. S. Kim, E. A. Kornev, V. Yu. Krasnichenko, A. L. Yascovich, M. N. Pavlinsky, “Low reflectivity coating in EUV,” Preprint No. 1880 (Space Research Institute of Russian Academy of Sciences, Moscow, 1993).

K. A. Moldosanov, M. A. Samsonov, L. S. Kim, “Optical element,” Russian Patent93057999 (1993).

M. A. Samsonov, K. A. Moldosanov, L. S. Kim, “Method of fabrication of optical elements,” Russian patent93058000 (1993).

C. C. Blatchley, E. A. Johnson, “Rugged dark materials for stray light suppression by seeded ion texturing,” in Stray Radiation in Optical Systems II, R. P. Breault, ed., Proc. SPIE1753, 317–326 (1992).
[CrossRef]

C. M. Egert, D. D. Allred, “Diffuse absorbing beryllium coatings produced by magnetron sputtering,” in Stray Radiation in Optical Systems, R. P. Breault, ed., Proc. SPIE1331, 170–178 (1990).
[CrossRef]

Herberts GmbH, Fritz-Hecker-Strasse 47-107, Köln 51, Germany.

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Figures (5)

Fig. 1
Fig. 1

Scanning electron microscope picture of one of the OKB samples.

Fig. 2
Fig. 2

Normal-incidence THR(α = 0°) at 121.6 nm. The results for the OKB coatings at (5, 6, 7) are compared with the results of Ref. 2 (4, bead-blasted, alodined Al) and those for tarnished Au (1) CuO (9), and black Cu2S (8) from Ref. 1: 1, 2, Al-Z; 3, Al-PSI; 4, Al-SSL; 5, OKB-3; 6, OKB-38; 7, OKB-8; 8, Cu2S; 9, CuO.

Fig. 3
Fig. 3

THR at 121.6 nm for grazing angle incidence (α = 75, 85°). Results from the present investigation (2–7) are compared with those for CuO (9) and black Cu2S (8) from Ref. 1 and bead-blasted, alodined Al (1) from Ref. 2: 1, Al-SSL; 2, Al-PSI; 3, Mg; 4, OKB-8; 5, Herberts; 6, OKB-3; 7, OKB-38; 8, Cu2S; 9, CuO.

Fig. 4
Fig. 4

Ratio R(α = 75°, β = 75°)/THR, plotted for the surfaces studied here (2–7) and for CuO (9) and black Cu2S (8) from Ref. 1: 2, Al-PSI; 3, Mg; 4, OKB-8; 5, Herberts; 6, OKB-3; 7, OKB-38; 8, Cu2S; 9, CuO.

Fig. 5
Fig. 5

Energy dependence of THR(α = 85°) between 17.1 and 121.6 nm. For clarity the error bars have been omitted, and the curves serve merely to guide the eye.

Tables (1)

Tables Icon

Table 1 Total Hemispherical Reflectance [THR(α]a

Metrics