Abstract

We introduce two new approaches for near-real-time, high-precision tracking of the refractive index of the ambient atmosphere. The methods can be realized at low cost and are expected to have important practical application in those accurate dimensional metrology applications employing interferometry in air. A valuable potential application is the control of step-and-repeat mask positioning for integrated circuit production in which temporal stability time scales over days can be crucial. Extension of the methods to absolute index measurement is discussed.

© 1997 Optical Society of America

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