An optical system for the parallel evaluation of in-plane and out-of-plane deformations is described. The object is illuminated from two different directions and imaged onto a CCD sensor. Each illumination interferes with its corresponding reference beam. This produces two sensitivity vectors. The references have different directions in order to produce two-directional spatial carriers. Two separate interferograms of an object under test in its undeformed and deformed states are recorded. The Fourier method is used for the quantitative evaluation. The measurements along different sensitivity vectors are separated in the Fourier domain. The phases of the two interferograms are obtained from the complex amplitudes, and the two-dimensional deformation is calculated from the phases. Two different arrangements (with and without a lens system) are presented together with some experimental results.
© 1997 Optical Society of AmericaFull Article | PDF Article
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