Abstract

We have developed a fringe analyzer that delivers the phase distribution at a video rate from a fringe pattern containing a spatial carrier. It is based on parallel generations of three phase-shifted moiré patterns through electronic multiplication with computer-generated reference gratings and low-pass filtering. The phase distribution is derived by the subsequent parallel processing of these patterns on the basis of a three-step phase-shifting algorithm. By modification of the bias phase distribution of the reference gratings, several functions, such as correction of an initial wave-front error, are realized in real time. The usefulness of this analyzer is demonstrated experimentally for phase measurements by grating-projection surface topography and interferometry.

© 1997 Optical Society of America

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