Abstract

The potential of double-wavelength interferometry is well known, especially regarding the capability of performing absolute distance measurements of rough targets with high resolutions. We describe the experimental results obtained with a demonstration model of a double-wavelength interferometer with superheterodyne detection. Our system, implemented with two four-quadrant detectors to improve the detection probability, has demonstrated the ability to reach resolutions of 0.2 mm at 5-m distances on rough targets in 50-ms integration time.

© 1997 Optical Society of America

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    [CrossRef]
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    [CrossRef]
  4. R. Dandliker, M. Geiser, C. Giunti, S. Zatti, G. Margheri, “Improvement of speckle statistics in double-wavelength superheterodyne interferometry,” Appl. Opt. 34, 7197–7201 (1995).
    [CrossRef] [PubMed]
  5. J. W. Goodman, “Statistical properties of laser speckles and related phenomena,” in Laser Speckles and Related Phenomena (Springer-Verlag, New York, 1975), pp. 9–75.
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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  14. C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
    [CrossRef]

1995 (1)

1988 (1)

1986 (1)

1985 (1)

1984 (1)

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

1977 (1)

1973 (1)

1971 (1)

Abtibol, C.

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

Chabran, C.

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

Dandliker, R.

Fercher, A. F.

Gallion, P.

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

Geiser, M.

Giunti, C.

R. Dandliker, M. Geiser, C. Giunti, S. Zatti, G. Margheri, “Improvement of speckle statistics in double-wavelength superheterodyne interferometry,” Appl. Opt. 34, 7197–7201 (1995).
[CrossRef] [PubMed]

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

Goodman, J. W.

J. W. Goodman, “Statistical properties of laser speckles and related phenomena,” in Laser Speckles and Related Phenomena (Springer-Verlag, New York, 1975), pp. 9–75.

Hu, H. Z.

Kingstone, R. H.

R. H. Kingstone, “Coherent detection of infrared radiation,” in Detection of Optical and Infrared Radiation, (Springer-Verlag, New York, 1978), pp. 24–39.

Manhart, S.

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

Marcuse, D.

D. Marcuse, Light Transmission Optics, 2nd ed. (Van Nostrand Reinhold, New York, 1982), p. 338.

Margheri, G.

R. Dandliker, M. Geiser, C. Giunti, S. Zatti, G. Margheri, “Improvement of speckle statistics in double-wavelength superheterodyne interferometry,” Appl. Opt. 34, 7197–7201 (1995).
[CrossRef] [PubMed]

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

Maurer, R.

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

Nakajima, H.

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

Polhemus, C.

Prongue, D.

Sodnick, Z.

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

Thalmann, R.

Tilford, C. R.

Tiziani, H. J.

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

Vry, U.

Wyant, J. C.

J. C. Wyant, “Testing aspherics using two-wavelength holography,” Appl. Opt. 10, 2113–2118 (1971).
[CrossRef] [PubMed]

J. C. Wyant, “Holographic and moire techniques,” in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 397–402.

Zatti, S.

R. Dandliker, M. Geiser, C. Giunti, S. Zatti, G. Margheri, “Improvement of speckle statistics in double-wavelength superheterodyne interferometry,” Appl. Opt. 34, 7197–7201 (1995).
[CrossRef] [PubMed]

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

Appl. Opt. (5)

J. Opt. (Paris) (1)

C. Abtibol, P. Gallion, H. Nakajima, C. Chabran, “Analyse de la lergeur spectrale d’un laser semiconducteur per interferometrie heterodyne synthetique,” J. Opt. (Paris) 15, 411–418 (1984).
[CrossRef]

J. Opt. Soc. Am. A (1)

Opt. Lett. (1)

Other (6)

J. W. Goodman, “Statistical properties of laser speckles and related phenomena,” in Laser Speckles and Related Phenomena (Springer-Verlag, New York, 1975), pp. 9–75.

J. C. Wyant, “Holographic and moire techniques,” in Optical Shop Testing, D. Malacara, ed. (Wiley, New York, 1978), pp. 397–402.

S. Manhart, G. Margheri, R. Maurer, C. Giunti, S. Zatti, H. J. Tiziani, Z. Sodnick, “Surface profile monitoring final report,” (European Space Agency, Munich, 1990).

S. Manhart, G. Margheri, C. Giunti, S. Zatti, R. Maurer, R. Dandliker, H. J. Tiziani, “Configuration analysis,” in Optical Surface Profile Monitor Final Report, (European Space Agency, Munich, 1995), pp. 1–55.

R. H. Kingstone, “Coherent detection of infrared radiation,” in Detection of Optical and Infrared Radiation, (Springer-Verlag, New York, 1978), pp. 24–39.

D. Marcuse, Light Transmission Optics, 2nd ed. (Van Nostrand Reinhold, New York, 1982), p. 338.

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