Abstract

The standard ultraviolet through short-wave infrared (200–2500-nm) diffuse-reflectance material, Halon PTFE, type G-80, is no longer available. Therefore an equivalent diffuse-reflectance standard material must be found. Algoflon F6 is shown here to be an appropriate replacement through the presentation of measurements of various spectral-reflectance properties of Halon and Algoflon F6. The measurements include spectral hemispherical reflectance, spectral bidirectional reflectance factor (BRF), sample BRF repeatability, and sample lifetime.

© 1997 Optical Society of America

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References

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  1. V. R. Weidner, J. J. Hsia, “Reflection properties of pressed polytetrafluoroethylene powder,” Appl. Opt. 71, 856–861 (1981).
  2. V. R. Weidner, J. J. Hsia, B. Adams, “Laboratory intercomparison study of pressed polytetrafluoroethylene powder reflectance standards,” Appl. Opt. 24, 2225–2230 (1985).
    [CrossRef] [PubMed]
  3. M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric data for Pressed PTFE primary transfer standard,” (Center for Imaging Science, Rochester Institute of Technology, Rochester, N.Y., Oct.1987).
  4. M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric analysis of pressed PTFE powder for use as a primary transfer standard,” Appl. Opt. 27, 3392–3396 (1988).
    [CrossRef] [PubMed]
  5. M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
    [CrossRef]
  6. F. Grum, M. Saltzman, “New white standard of reflectance,” , Vol. P-75-77 (Commission Internationale de l’Eclairage, Paris, France, 1976), pp. 91–98.
  7. “A Review of publications on properties and reflection values of material reflection standards,” , Vol. TC-2.3 (Bureau Central de la Commission Internationale de l’Eclairage, Paris, France, 1979).
  8. F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
    [CrossRef]
  9. Ausimont USA, Inc., 10 Leonards Lane, Thorofare, N.J. 08086.
  10. D. Barnett, Ausimont USA, Inc., 10 Leonards Lane, Thorofare, N.J. 08086 (personal communication, June1994).
  11. J. J. Hsia, V. R. Weidner, “NBS 45°/normal reflectometer for absolute reflectance factors,” Metrologia 17, 97–102 (1981).
    [CrossRef]
  12. “ASTM E259-91, Standard practice for preparation of pressed powder white reflectance factor transfer standards for hemispherical geometry,” in Annual Book of ASTM Standards, Vol. 06.01: Paint—Tests for Chemical, Physical, and Optical Properties; Appearance (American Society for Testing and Materials, West Conshohocken, Pa., 1991).

1990

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

1988

1985

1983

F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
[CrossRef]

1981

J. J. Hsia, V. R. Weidner, “NBS 45°/normal reflectometer for absolute reflectance factors,” Metrologia 17, 97–102 (1981).
[CrossRef]

V. R. Weidner, J. J. Hsia, “Reflection properties of pressed polytetrafluoroethylene powder,” Appl. Opt. 71, 856–861 (1981).

Adams, B.

Barnett, D.

D. Barnett, Ausimont USA, Inc., 10 Leonards Lane, Thorofare, N.J. 08086 (personal communication, June1994).

Berns, R. S.

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

Clarke, F. J. J.

F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
[CrossRef]

Daoust, D. J. O.

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric analysis of pressed PTFE powder for use as a primary transfer standard,” Appl. Opt. 27, 3392–3396 (1988).
[CrossRef] [PubMed]

M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric data for Pressed PTFE primary transfer standard,” (Center for Imaging Science, Rochester Institute of Technology, Rochester, N.Y., Oct.1987).

Fairchild, M. D.

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric analysis of pressed PTFE powder for use as a primary transfer standard,” Appl. Opt. 27, 3392–3396 (1988).
[CrossRef] [PubMed]

M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric data for Pressed PTFE primary transfer standard,” (Center for Imaging Science, Rochester Institute of Technology, Rochester, N.Y., Oct.1987).

Garforth, F. A.

F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
[CrossRef]

Grum, F.

F. Grum, M. Saltzman, “New white standard of reflectance,” , Vol. P-75-77 (Commission Internationale de l’Eclairage, Paris, France, 1976), pp. 91–98.

Hsia, J. J.

V. R. Weidner, J. J. Hsia, B. Adams, “Laboratory intercomparison study of pressed polytetrafluoroethylene powder reflectance standards,” Appl. Opt. 24, 2225–2230 (1985).
[CrossRef] [PubMed]

J. J. Hsia, V. R. Weidner, “NBS 45°/normal reflectometer for absolute reflectance factors,” Metrologia 17, 97–102 (1981).
[CrossRef]

V. R. Weidner, J. J. Hsia, “Reflection properties of pressed polytetrafluoroethylene powder,” Appl. Opt. 71, 856–861 (1981).

Parry, D. J.

F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
[CrossRef]

Peterson, J.

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

Saltzman, M.

F. Grum, M. Saltzman, “New white standard of reflectance,” , Vol. P-75-77 (Commission Internationale de l’Eclairage, Paris, France, 1976), pp. 91–98.

Weidner, V. R.

V. R. Weidner, J. J. Hsia, B. Adams, “Laboratory intercomparison study of pressed polytetrafluoroethylene powder reflectance standards,” Appl. Opt. 24, 2225–2230 (1985).
[CrossRef] [PubMed]

J. J. Hsia, V. R. Weidner, “NBS 45°/normal reflectometer for absolute reflectance factors,” Metrologia 17, 97–102 (1981).
[CrossRef]

V. R. Weidner, J. J. Hsia, “Reflection properties of pressed polytetrafluoroethylene powder,” Appl. Opt. 71, 856–861 (1981).

Appl. Opt.

Color Res. Appl.

M. D. Fairchild, D. J. O. Daoust, J. Peterson, R. S. Berns, “Absolute reflectance factor calibration for goniospectrophotometry,” Color Res. Appl. 15, 311–320 (1990).
[CrossRef]

Light Res. Technol.

F. J. J. Clarke, F. A. Garforth, D. J. Parry, “Goniophotometric and polarization properties of white reflection standard materials,” Light Res. Technol. 15, 133–149 (1983).
[CrossRef]

Metrologia

J. J. Hsia, V. R. Weidner, “NBS 45°/normal reflectometer for absolute reflectance factors,” Metrologia 17, 97–102 (1981).
[CrossRef]

Other

“ASTM E259-91, Standard practice for preparation of pressed powder white reflectance factor transfer standards for hemispherical geometry,” in Annual Book of ASTM Standards, Vol. 06.01: Paint—Tests for Chemical, Physical, and Optical Properties; Appearance (American Society for Testing and Materials, West Conshohocken, Pa., 1991).

M. D. Fairchild, D. J. O. Daoust, “Goniospectrophotometric data for Pressed PTFE primary transfer standard,” (Center for Imaging Science, Rochester Institute of Technology, Rochester, N.Y., Oct.1987).

Ausimont USA, Inc., 10 Leonards Lane, Thorofare, N.J. 08086.

D. Barnett, Ausimont USA, Inc., 10 Leonards Lane, Thorofare, N.J. 08086 (personal communication, June1994).

F. Grum, M. Saltzman, “New white standard of reflectance,” , Vol. P-75-77 (Commission Internationale de l’Eclairage, Paris, France, 1976), pp. 91–98.

“A Review of publications on properties and reflection values of material reflection standards,” , Vol. TC-2.3 (Bureau Central de la Commission Internationale de l’Eclairage, Paris, France, 1979).

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Figures (10)

Fig. 1
Fig. 1

Schematic of BRF instrumentation.

Fig. 2
Fig. 2

PTFE press used to make standard diffuse reflectance samples.

Fig. 3
Fig. 3

Hemispherical reflectance ratios of Algoflon to Halon.

Fig. 4
Fig. 4

BRF comparison of a good Halon sample and a good Algoflon sample with a varying incidence angle and the detector fixed normal to the sample. Wavelengths are (a) 450 nm, (b) 700 nm, (c) 1040 nm.

Fig. 5
Fig. 5

BRF comparison of an acceptable Halon sample and an unacceptable Algoflon sample with a varying incidence angle and the detector fixed normal to the sample. Wavelengths are (a) 450 nm, (b) 700 nm, (c) 1040 nm.

Fig. 6
Fig. 6

BRF comparison of an acceptable Halon sample and an acceptable Algoflon sample with a fixed incidence angle and a varying detector view angle. Incidence angles and wavelengths are (a) 10° and 450 nm, (b) 30° and 450 nm, (c) 60° and 450 nm, (d) 10° and 700 nm, (e) 30° and 700 nm, (f) 60° and 700 nm, (g) 10° and 1040 nm, (h) 30° and 1040 nm, (i) 60° and 1040 nm.

Fig. 7
Fig. 7

BRF of Halon and Algoflon as a function of wavelength with a normal detector viewing angle. The incidence angles are (a) 10°, (b) 30°, (c) 60°.

Fig. 8
Fig. 8

BRF comparison of four Halon samples with a varying incidence angle and the detector fixed normal to the sample. Wavelengths are (a) 450 nm, (b) 700 nm, (c) 1040 nm.

Fig. 9
Fig. 9

BRF comparison of four Algoflon samples with a varying incidence angle and the detector fixed normal to the sample. Wavelengths are (a) 450 nm, (b) 700 nm, (c) 1040 nm.

Fig. 10
Fig. 10

Two BRF measurements of the same Algoflon sample spaced in time by approximately 9 months. Wavelengths are (a) 450 nm, (b) 700 nm, (c) 1040 nm.

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

R0°/h=2π 0π/2 R0°/θcos θ sin θ dθ2π 0π/2 cos θ sin θ dθ.
R0°/hR0°/45°=2 0π/2R0°/θR0°/45° sin θ cos θ dθ.
R0°/hR0°/45°=20π/2B0°/θsinθ cos θ dθ,
B0°/θ=Φ0°/θ/cos θΦ0°/45°/cos 45°,
B0°/θ=i=0n biθi.
R0°/hR0°/45°=2i=0n biIi,
Ii=0π/2 θi sin θ cos θ dθ.

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