Abstract

A full-wave method is used to evaluate the Mueller matrix elements for scattering from layered structures with random rough surfaces. These provide a database for applications in optical detection over a broad range of rough surface statistical parameters. They can be used to determine the optimal frequencies and incident angles that provide most reliable measurements for optical detection. The elements of the Mueller matrix that are most sensitive to medium parameters of the layered structures can also be identified. Contributions from individual terms of the full-wave solutions are shown to have distinct physical interpretations.

© 1997 Optical Society of America

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