Abstract

The effects of temperature and pressure on the stability of a high-finesse interferometer are considered, and the design of a high-finesse interferometer that minimizes these effects is presented. The high-finesse interferometer has a free spectral range of 23,600 MHz, a finesse of greater than 30,000, and a measured stability of better than 7 MHz/h (0.3 mfringes/h).

© 1996 Optical Society of America

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References

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  1. K. S. Repasky, L. E. Watson, J. L. Carlsten, “High-finesse interferometers,” Appl. Opt. 34, 2615–2618 (1995).
    [Crossref] [PubMed]
  2. J. M. Vaughan, The Fabry-Perot Interferometer: History, Theory, Practice and Application (Hilger, London, 1989).
  3. G. Hernandez, Fabry-Perot Interferometers (Cambridge U. Press, Cambridge, U.K., 1986).
  4. The ULE Corning code 7971 titanium silicate was purchased from United Lens Company, Southbridge, Mass. 01550.
  5. ULE Corning code 7971 Titanium Silicate Zero Expansion Material, Corning Publication ULE-12/90-2000 (Technical Products Division, Advanced Product Department, Corning, Inc., MP-24-4, Corning, N.Y.).

1995 (1)

Carlsten, J. L.

Hernandez, G.

G. Hernandez, Fabry-Perot Interferometers (Cambridge U. Press, Cambridge, U.K., 1986).

Repasky, K. S.

Vaughan, J. M.

J. M. Vaughan, The Fabry-Perot Interferometer: History, Theory, Practice and Application (Hilger, London, 1989).

Watson, L. E.

Appl. Opt. (1)

Other (4)

J. M. Vaughan, The Fabry-Perot Interferometer: History, Theory, Practice and Application (Hilger, London, 1989).

G. Hernandez, Fabry-Perot Interferometers (Cambridge U. Press, Cambridge, U.K., 1986).

The ULE Corning code 7971 titanium silicate was purchased from United Lens Company, Southbridge, Mass. 01550.

ULE Corning code 7971 Titanium Silicate Zero Expansion Material, Corning Publication ULE-12/90-2000 (Technical Products Division, Advanced Product Department, Corning, Inc., MP-24-4, Corning, N.Y.).

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Figures (4)

Fig. 1
Fig. 1

Schematic of the stabilized HFI. The FSR is 23,600 MHz with a finesse of 30,000 and a measured stability of 7 MHz/h.

Fig. 2
Fig. 2

Experimental setup for measuring the stability of the HFI.

Fig. 3
Fig. 3

Schematic of the circuit used for building a low-noise ramp generator. Resistor R and capacitor C were chosen so that the integrator part of the circuit would have the proper slope that is needed to scan the PZT. The clock has less than 5 × 106 noise.

Fig. 4
Fig. 4

Comparison of drift with and without control of the temperature and pressure. The dashed line represents data taken without control. A commercial ramp generator was used to scan the PZT. The maximum frequency drift is greater than 200 MHz/h and shot-to-shot noise is greater than 40 MHz. The solid line represents data taken with control. A ramp generator built from the schematic shown in Fig. 3 was used to drive the PZT. The maximum frequency drift is less than 7 MHz/h and shot-to-shot noise is greatly reduced. The inset is an expanded view of the drift with temperature and pressure control using the ramp generator built from the schematic shown in Fig. 3.

Equations (1)

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FSR = c / 2 n d ,

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