Abstract

Laser-induced damage studies have been carried out on single-crystal silicon and silicon-based photo-detectors, FND 100 P-I-N photodiodes, and C30954E avalanche photodiodes as a function of repetition frequency for a 1064-nm wavelength. It has been observed that the damage threshold decreases significantly when the samples are irradiated with a large number of pulses. However, this effect is evident only when the repetition frequency is greater than 1 Hz. The results are discussed in light of various existing theories.

© 1996 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).
  2. F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).
  3. C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).
  4. A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).
  5. A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).
  6. A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).
  7. S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).
  8. M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).
  9. V. K. Arora, A. L. Dawar, “Effect of laser irradiation on the responsivity of mercury cadmium telluride detectors,” Infrared Phys. Technol. 37, 245–249 (1996).
  10. J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).
  11. T. Whittaker, R. Goedert, D. Templeton, “Laser induced damage in Schott’s OG-550,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 88–95 (1990).
  12. Y. K. Jhee, M. F. Becker, R. M. Walser, “Charge emission and precursor accumulation in the multiple pulse damage regime of silicon,” J. Opt. Soc. Am. B 2, 1626–1633 (1985).
  13. R. T. Bailey, F. R. Cruickshank, P. Kerkoc, D. Pugh, J. N. Sherwood, “Surface damage of (-)2-(α-methylbenzylamino)-5-nitropyridine single crystals induced by pulsed laser radiation,” Appl. Opt. 34, 1239–1244 (1995).
  14. L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).
  15. C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).
  16. A. Chmel, S. B. Eronko, “Laser induced generation of structural defects in vitreous silica and in activated silicate glass,” J. Non-Cryst. Solids 70, 45–52 (1985).
  17. R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).
  18. V. Nathan, “Repetitively pulsed laser damage in thin films,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 583–593 (1992).
  19. J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).
  20. W. W. Duley, CO2 Lasers: Effects and Applications (Academic, New York, 1976), Chap. 4, p. 140.
  21. I. G. Kytina, B. E. Kinber, “Fatigue fracture of glasses under laser irradiation conditions,” Sov. J. Quantum Electron. 7, 2427–2431 (1980).
  22. S. T. Wu, M. Bass, “Laser induced irreversible absorption changes in alkali halides at 10.6 μm,” Appl. Phys. Lett. 39, 948–950 (1981).
  23. K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).
  24. N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).
  25. N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).
  26. Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).
  27. J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).
  28. D. Kitriotis, L. D. Merkle, “Multiple pulse laser induced damage phenomena in silicates,” Appl. Opt. 28, 949–958 (1989).
  29. M. Bass, H. Barett, “Avalanche breakdown and the probabilistic nature of laser induced damage,” IEEE J. Quantum Electron. QE-8, 338–343 (1972).

1996 (1)

V. K. Arora, A. L. Dawar, “Effect of laser irradiation on the responsivity of mercury cadmium telluride detectors,” Infrared Phys. Technol. 37, 245–249 (1996).

1995 (1)

1993 (1)

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

1991 (1)

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

1990 (2)

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).

1989 (1)

1986 (1)

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).

1985 (3)

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

A. Chmel, S. B. Eronko, “Laser induced generation of structural defects in vitreous silica and in activated silicate glass,” J. Non-Cryst. Solids 70, 45–52 (1985).

Y. K. Jhee, M. F. Becker, R. M. Walser, “Charge emission and precursor accumulation in the multiple pulse damage regime of silicon,” J. Opt. Soc. Am. B 2, 1626–1633 (1985).

1984 (1)

L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).

1983 (1)

N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).

1982 (2)

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

1981 (1)

S. T. Wu, M. Bass, “Laser induced irreversible absorption changes in alkali halides at 10.6 μm,” Appl. Phys. Lett. 39, 948–950 (1981).

1980 (2)

J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).

I. G. Kytina, B. E. Kinber, “Fatigue fracture of glasses under laser irradiation conditions,” Sov. J. Quantum Electron. 7, 2427–2431 (1980).

1978 (2)

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

1975 (1)

R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).

1972 (1)

M. Bass, H. Barett, “Avalanche breakdown and the probabilistic nature of laser induced damage,” IEEE J. Quantum Electron. QE-8, 338–343 (1972).

Arora, V. K.

V. K. Arora, A. L. Dawar, “Effect of laser irradiation on the responsivity of mercury cadmium telluride detectors,” Infrared Phys. Technol. 37, 245–249 (1996).

Baeri, P.

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

Bailey, R. T.

Barett, H.

M. Bass, H. Barett, “Avalanche breakdown and the probabilistic nature of laser induced damage,” IEEE J. Quantum Electron. QE-8, 338–343 (1972).

Bartoli, F. J.

J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).

Bass, M.

L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).

N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).

S. T. Wu, M. Bass, “Laser induced irreversible absorption changes in alkali halides at 10.6 μm,” Appl. Phys. Lett. 39, 948–950 (1981).

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

M. Bass, H. Barett, “Avalanche breakdown and the probabilistic nature of laser induced damage,” IEEE J. Quantum Electron. QE-8, 338–343 (1972).

Becker, M. F.

S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).

Y. K. Jhee, M. F. Becker, R. M. Walser, “Charge emission and precursor accumulation in the multiple pulse damage regime of silicon,” J. Opt. Soc. Am. B 2, 1626–1633 (1985).

M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).

C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).

Belyaev, N. N.

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

Bredichin, V. I.

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

Brusasco, R. M.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Campbell, J. H.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Campisano, S. V.

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

Chauhan, G.

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

Chmel, A.

A. Chmel, S. B. Eronko, “Laser induced generation of structural defects in vitreous silica and in activated silicate glass,” J. Non-Cryst. Solids 70, 45–52 (1985).

Cruickshank, F. R.

Dawar, A. L.

V. K. Arora, A. L. Dawar, “Effect of laser irradiation on the responsivity of mercury cadmium telluride detectors,” Infrared Phys. Technol. 37, 245–249 (1996).

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

Decker, D. L.

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

DeMarco, F. P.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Duley, W. W.

W. W. Duley, CO2 Lasers: Effects and Applications (Academic, New York, 1976), Chap. 4, p. 140.

Durand, J. P.

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

Dyumaev, K. M.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Eronko, S. B.

A. Chmel, S. B. Eronko, “Laser induced generation of structural defects in vitreous silica and in activated silicate glass,” J. Non-Cryst. Solids 70, 45–52 (1985).

Faith, W. N.

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

Foti, G.

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

Frohman-Bentchkowsky, D.

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).

Goedert, R.

T. Whittaker, R. Goedert, D. Templeton, “Laser induced damage in Schott’s OG-550,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 88–95 (1990).

Gonzales, R. P.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Greidman, G. I.

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

Griscom, D. L.

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

Ho, W. Y.

C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).

Jernigan, J. L.

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

Jhee, Y. K.

Kerkoc, P.

Kinber, B. E.

I. G. Kytina, B. E. Kinber, “Fatigue fracture of glasses under laser irradiation conditions,” Sov. J. Quantum Electron. 7, 2427–2431 (1980).

Kitriotis, D.

Koumvakalis, N.

N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).

Koumvaklis, N.

L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).

Kozlowski, M. R.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Kruer, M. R.

J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).

Kumar, A.

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

Kytina, I. G.

I. G. Kytina, B. E. Kinber, “Fatigue fracture of glasses under laser irradiation conditions,” Sov. J. Quantum Electron. 7, 2427–2431 (1980).

Le Gressus, C.

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

Le Moel, A.

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

Lee, C. S.

N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).

Ma, C.

C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).

Mall, R. P.

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

Manekov, A. A.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Maslyukov, A. P.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Mathur, P. C.

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

Matyushin, G. A.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Merkle, L. D.

D. Kitriotis, L. D. Merkle, “Multiple pulse laser induced damage phenomena in silicates,” Appl. Opt. 28, 949–958 (1989).

L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).

Meyer, J. R.

J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).

Milanovich, F. P.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Morgan, A. J.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Nathan, V.

V. Nathan, “Repetitively pulsed laser damage in thin films,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 583–593 (1992).

Nechitailo, V. S.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Nissan-Cohen, Y.

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).

Porteus, J. O.

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

Pugh, D.

Rainer, F.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Ray, S.

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

Rimini, E.

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

Rouse, R. L.

R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).

Rubakiha, V. I.

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

Scrivener, M. S.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Shappir, J.

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).

Sharma, S.

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

Sherwood, J. N.

Shishodia, P. K.

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

Staggs, M. C.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Taylor, R. T.

R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).

Templeton, D.

T. Whittaker, R. Goedert, D. Templeton, “Laser induced damage in Schott’s OG-550,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 88–95 (1990).

Thomas, I. M.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Tripathi, K. N.

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

Tsaprilov, A. S.

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Velsko, S. P.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

Vigouroux, J. P.

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

Walser, R. M.

S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).

Y. K. Jhee, M. F. Becker, R. M. Walser, “Charge emission and precursor accumulation in the multiple pulse damage regime of silicon,” J. Opt. Soc. Am. B 2, 1626–1633 (1985).

M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).

C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).

Watkins, S. E.

S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).

M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).

Whittaker, T.

T. Whittaker, R. Goedert, D. Templeton, “Laser induced damage in Schott’s OG-550,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 88–95 (1990).

Wolfe, C. R.

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

Wood, R. M.

R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).

Wu, S. T.

S. T. Wu, M. Bass, “Laser induced irreversible absorption changes in alkali halides at 10.6 μm,” Appl. Phys. Lett. 39, 948–950 (1981).

Zhang, C. Z.

S. E. Watkins, C. Z. Zhang, R. M. Walser, M. F. Becker, “Electrical performance of laser damaged silicon photodiodes,” Appl. Opt. 29, 827–835 (1990).

M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).

Appl. Opt. (3)

Appl. Phys. Lett. (2)

S. T. Wu, M. Bass, “Laser induced irreversible absorption changes in alkali halides at 10.6 μm,” Appl. Phys. Lett. 39, 948–950 (1981).

P. Baeri, S. V. Campisano, G. Foti, E. Rimini, “Arsenic diffusion in silicon by high power nanosecond laser pulsing,” Appl. Phys. Lett. 33, 137–140 (1978).

IEEE J. Quantum Electron. (2)

J. O. Porteus, D. L. Decker, J. L. Jernigan, W. N. Faith, M. Bass, “Evaluation of metal mirrors for high power applications by multithreshold damage analysis,” IEEE J. Quantum Electron. QE-14, 776–782 (1978).

M. Bass, H. Barett, “Avalanche breakdown and the probabilistic nature of laser induced damage,” IEEE J. Quantum Electron. QE-8, 338–343 (1972).

Infrared Phys. Technol. (1)

V. K. Arora, A. L. Dawar, “Effect of laser irradiation on the responsivity of mercury cadmium telluride detectors,” Infrared Phys. Technol. 37, 245–249 (1996).

J. Appl. Phys. (6)

A. L. Dawar, S. Ray, R. P. Mall, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of p-mercury cadmium telluride,” J. Appl. Phys. 70, 3516–3520 (1991).

A. L. Dawar, P. K. Shishodia, G. Chauhan, A. Kumar, P. C. Mathur, “Effect of laser irradiation on structural and electrical properties of CdS thin films,” J. Appl. Phys. 67, 6214–6219 (1990).

L. D. Merkle, N. Koumvaklis, M. Bass, “Laser induced bulk damage in SiO2,” J. Appl. Phys. 55, 772–775 (1984).

J. R. Meyer, M. R. Kruer, F. J. Bartoli, “Optical heating in semiconductors: Ge, Si, InSb, and GaAs,” J. Appl. Phys. 51, 5513–5522 (1980).

Y. Nissan-Cohen, J. Shappir, D. Frohman-Bentchkowsky, “Trap generation and occupation dynamics in SiO2 under charge injection stress,” J. Appl. Phys. 60, 2024–2035 (1986).

J. P. Vigouroux, J. P. Durand, A. Le Moel, C. Le Gressus, D. L. Griscom, “Electron trapping in amorphous SiO2 studied by charge build up under electron bombardment,” J. Appl. Phys. 57, 5139–5144 (1985).

J. Mater. Sci. (1)

A. L. Dawar, A. Kumar, S. Sharma, K. N. Tripathi, P. C. Mathur, “Effect of laser irradiation on structural, electrical and optical properties of SnO2 thin films,” J. Mater. Sci. 28, 639–644 (1993).

J. Non-Cryst. Solids (1)

A. Chmel, S. B. Eronko, “Laser induced generation of structural defects in vitreous silica and in activated silicate glass,” J. Non-Cryst. Solids 70, 45–52 (1985).

J. Opt. Soc. Am. B (1)

Opt. Eng. (1)

N. Koumvakalis, C. S. Lee, M. Bass, “Single and multiple pulse catastrophic damage in diamond turned Cu and Ag mirrors at 10.6, 1.06, and 0.532 μm,” Opt. Eng. 22, 419–423 (1983).

Opt. Laser Technol. (1)

R. M. Wood, R. T. Taylor, R. L. Rouse, “Laser damage in optical materials at 1.06 μm,” Opt. Laser Technol. 6, 105–111 (1975).

Sov. J. Quantum Electron. (2)

I. G. Kytina, B. E. Kinber, “Fatigue fracture of glasses under laser irradiation conditions,” Sov. J. Quantum Electron. 7, 2427–2431 (1980).

K. M. Dyumaev, A. A. Manekov, A. P. Maslyukov, G. A. Matyushin, V. S. Nechitailo, A. S. Tsaprilov, “Influence of the viscoelastic properties of the matrix and of the plasticizer on the optical strength of transparent polymers,” Sov. J. Quantum Electron. 9, 1318–1323 (1982).

Sov. Phys. JETP (1)

N. N. Belyaev, V. I. Bredichin, V. I. Rubakiha, G. I. Greidman, “Aging of α-LiIO3 laser irradiated single crystals,” Sov. Phys. JETP 83, 1065–1068 (1982).

Other (7)

V. Nathan, “Repetitively pulsed laser damage in thin films,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 583–593 (1992).

W. W. Duley, CO2 Lasers: Effects and Applications (Academic, New York, 1976), Chap. 4, p. 140.

C. Ma, W. Y. Ho, R. M. Walser, M. F. Becker, “Transient laser induced surface deformation of silicon in relation to damage,” in Laser-Induced Damage in Optical Materials: 1992, H. Bennett, L. Chase, A. Guenter, B. Newnam, M. J. Soileau, eds., Proc. SPIE 1848, 59–66 (1992).

T. Whittaker, R. Goedert, D. Templeton, “Laser induced damage in Schott’s OG-550,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 88–95 (1990).

F. Rainer, R. M. Brusasco, J. H. Campbell, F. P. DeMarco, R. P. Gonzales, M. R. Kozlowski, F. P. Milanovich, A. J. Morgan, M. S. Scrivener, M. C. Staggs, I. M. Thomas, S. P. Velsko, C. R. Wolfe, “Damage measurements on optical materials for use in high peak power lasers,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 74–83 (1990).

C. R. Wolfe, M. R. Kozlowski, J. H. Campbell, F. Rainer, A. J. Morgan, R. P. Gonzales, “Laser conditioning of optical thin films,” in Laser-Induced Damage in Optical Materials 1989, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. SPIE 1438, 360–375 (1990).

M. F. Becker, C. Z. Zhang, S. E. Watkins, R. M. Walser, “Laser induced damage to silicon CCD imaging sensors,” in Materials for Optical Switches, Isolators, and Limiters, M. J. Soileau, ed. Proc. SPIE 1105, 68–77 (1989).

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (5)

Fig. 1
Fig. 1

Experimental setup for the study of laser-induced damage studies: LS, 1064-nm laser source; F, neutral density filter; BS, beam splitter; P, energy/power meter; L1 and L2, lenses; D, photodetector.

Fig. 2
Fig. 2

Reflectivity versus laser energy.

Fig. 3
Fig. 3

Reflectivity as a function of number of pulses for laser fluences of 2.8 J/cm2: △, 0.1 Hz; □, 1 Hz; ○, 2 Hz; ●, 10 Hz.

Fig. 4
Fig. 4

Damage threshold as a function of laser pulses. The pulse repetition frequency is 10 Hz.

Fig. 5
Fig. 5

Leakage current as a function of irradiation energy in an FND 100 photodiode. We used 30 pulses at a rate of 10 Hz. The reverse bias voltage was 15 V.

Equations (3)

Equations on this page are rendered with MathJax. Learn more.

Δ T = ( 1 - R ) E DAM ρ c L H ,
L H = 1 α 1 + α 2 + α F c ,
T ( z , t ) t > τ = 2 F 0 k 1 / 2 K { t 1 / 2 i erfc z 2 ( k t ) 1 / 2 - ( t - τ ) 1 / 2 i erfc z 2 [ k ( t - τ ) 1 / 2 ] } ,

Metrics