Abstract

A new Commission Internationale de l’Eclairage daylight D65 filter has been developed for a xenon arc. The filter comprises a pair of multilayer stacks, and excellent agreement is obtained between the spectral power distribution associated with this filter–source combination and that of daylight for the entire wavelength range from 300 to 800 nm.

© 1996 Optical Society of America

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References

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  1. I. Powell, “Quartz–halogen D65 simulation,” Appl. Opt. 34, 7986–7997 (1995).
    [CrossRef] [PubMed]
  2. G. Wyszecki, “Development of new CIE standard sources for colorimetry,” Die Farbe 19, 43 (1970).
  3. CIE, “A method for assessing the quality of daylight simulators for colorimetry,” CIE Publication 51, TC 1.3 (Bureau Central Commission Internationale de l’Eclairage, Paris, 1981).

1995 (1)

1970 (1)

G. Wyszecki, “Development of new CIE standard sources for colorimetry,” Die Farbe 19, 43 (1970).

Powell, I.

Wyszecki, G.

G. Wyszecki, “Development of new CIE standard sources for colorimetry,” Die Farbe 19, 43 (1970).

Appl. Opt. (1)

Die Farbe (1)

G. Wyszecki, “Development of new CIE standard sources for colorimetry,” Die Farbe 19, 43 (1970).

Other (1)

CIE, “A method for assessing the quality of daylight simulators for colorimetry,” CIE Publication 51, TC 1.3 (Bureau Central Commission Internationale de l’Eclairage, Paris, 1981).

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Figures (9)

Fig. 1
Fig. 1

Spectral power distribution associated with the quartz–halogen lamp, the xenon arc, and daylight D65.

Fig. 2
Fig. 2

Comparison of the spectral power distribution associated with Powell’s quartz–halogen filter–source combination and daylight D65.

Fig. 3
Fig. 3

Ideal spectral transmission filter curves for quartz–halogen and xenon arc sources.

Fig. 4
Fig. 4

Comparison of the spectral power distribution associated with the xenon arc filter–source combination and daylight D65.

Fig. 5
Fig. 5

Allowable range of chromaticity of daylight simulator for colorimetry D65.

Fig. 6
Fig. 6

Spectral reflection curve associated with nonfluorescent sample together with its corresponding parameters.

Fig. 7
Fig. 7

Histogram depicting the frequency of occurrence as a function of the magnitude of the chromaticity error associated with both quartz–halogen and xenon arc designs for nonfluorescent samples.

Fig. 8
Fig. 8

Spectral reflection radiance, external radiant efficiency, and fluorescent radiance curves associated with a fluorescent sample together with its corresponding parameters.

Fig. 9
Fig. 9

Histogram depicting the frequency of occurrence as a function of the magnitude of the chromaticity error associated with both quartz–halogen and xenon arc designs with fluorescent samples.

Tables (5)

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Table 1 Prescription for the Xenon Arc Filter Design

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Table 2 Color Difference Between Stimuli from Nonfluorescent Metameric Sample Pairs Illuminated by Simulators

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Table 3 Color Difference Between Stimuli from Fluorescent Metameric Sample Pairs Illuminated by Simulators

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Table 4 Color Difference for the Average of Nonfluorescent Metameric Sample Pairs Illuminated by Both D65 and Simulators

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Table 5 Color Difference for the Average of Fluorescent Metameric Sample Pairs Illuminated by Both D65 and Simulators

Equations (5)

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X = x Y / y , Y = Y , Z = ( 1 x y ) Y / y .
L * = 116 f ( Y / Y n ) 16 , a * = 500 [ f ( X / X n ) f ( Y / Y n ) ] , b * = 200 [ f ( Y / Y n ) f ( Z / Z n ) ] .
Δ E CIELAB = { [ ( L 1 * L 2 * ) 2 + ( a 1 * a 2 * ) 2 + ( b 1 * b 2 * ) 2 ] } 1 / 2 .
β T ( λ ) = β S ( λ ) + F ( λ ) / S n ( λ ) 300 460 S n ( λ ) Q ( λ ) Δ λ ,
MI UV = j = 1 3 Δ E j / 3 .

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