Abstract

A system for analyzing single-layer optical thin films has been formulated by the use of artificial neural networks. The training data sets stem from the computational results of the physical model of thin films, and they are used to train the artificial neural network, which, when done, can give values of film parameters in the millisecond time regime. The fast backpropagation algorithm is employed during training. The results of training are also given.

© 1996 Optical Society of America

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