Abstract

It is shown that it is possible to design normal-incidence antireflection coatings that simultaneously reduce the reflectance of two different substrates. Although this is at the expense of some deterioration in performance when compared with that of conventional coatings, it can lead to significant time and cost savings in small thin-film production facilities. Numerical examples are presented for ZnS/ZnSe, Si/Ge, and ZnS/Ge substrate pairs. The experimental measurements on one such coating are in good agreement with the calculated performance.

© 1996 Optical Society of America

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References

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  1. H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, New York, 1986), Chaps. 2 and 3.
    [CrossRef]
  2. S. A. Purman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette, 1992), Chap. 2.
  3. B. T. Sullivan, J. A. Dobrowolski, “Implementation of a numerical needle method for thin film design,” in Optical Interference Coatings, Vol. 17 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D. C., 1995), pp. 72–74.

Dobrowolski, J. A.

B. T. Sullivan, J. A. Dobrowolski, “Implementation of a numerical needle method for thin film design,” in Optical Interference Coatings, Vol. 17 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D. C., 1995), pp. 72–74.

Macleod, H. A.

H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, New York, 1986), Chaps. 2 and 3.
[CrossRef]

Purman, S. A.

S. A. Purman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette, 1992), Chap. 2.

Sullivan, B. T.

B. T. Sullivan, J. A. Dobrowolski, “Implementation of a numerical needle method for thin film design,” in Optical Interference Coatings, Vol. 17 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D. C., 1995), pp. 72–74.

Tikhonravov, A. V.

S. A. Purman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette, 1992), Chap. 2.

Other (3)

H. A. Macleod, Thin Film Optical Filters (McGraw-Hill, New York, 1986), Chaps. 2 and 3.
[CrossRef]

S. A. Purman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette, 1992), Chap. 2.

B. T. Sullivan, J. A. Dobrowolski, “Implementation of a numerical needle method for thin film design,” in Optical Interference Coatings, Vol. 17 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D. C., 1995), pp. 72–74.

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Figures (4)

Fig. 1
Fig. 1

A, B, Calculated reflectances of AR-coated ZnSe and ZnS surfaces, respectively. C, Refractive-index profile of the eight-layer AR coating used on both substrates.

Fig. 2
Fig. 2

A, B, Calculated reflectances of AR-coated Ge and Si surfaces, respectively. C, Refractive-index profile of the nine-layer AR coating used on both substrates. The dotted curves in A and B represent the measured performances of such a coating.

Fig. 3
Fig. 3

A, B, The continuous curves represent the calculated reflectances of Ge and ZnS surfaces, respectively, coated with an 11-layer AR system designed specifically for these substrates. The refractive-index profile of that system is shown in C. The dotted curves in A and B are the reflectances of the Ge and ZnS surfaces coated with an 11-layer AR system designed for a substrate of refractive index ns = 3.2. The refractive-index profile of that system is shown in D.

Fig. 4
Fig. 4

Calculated reflectances of AR coatings designed specifically for either, A, a Ge or, B, a Si substrate. The dotted curves represent the reflectances of the two-substrate AR design of Fig. 2. All coatings have essentially the same total optical thickness.

Equations (2)

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R = [ Y ( η s δ η ) Y + ( η s δ η ) ] [ Y ( η s δ η ) Y + ( η s δ η ) ] * , R 0 = ( Y η s Y + η s ) ( Y η s Y + η s ) * , R + = [ Y ( η s + δ η ) Y + ( η s + δ η ) ] [ Y ( η s + δ η ) Y + ( η s + δ η ) ] * .
R = ( δ n 2 n s δ n ) 2 , R 0 = 0 , R + = ( δ n 2 n s + δ n ) 2 .

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