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Fourier transform technique with frequency filtering for optical thin-film design

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Abstract

A Fourier analysis of existing and potentially complex refractive index profiles is often useful in the resolution of thin-film design problems. Applications of a frequency-filtering technique, which consists of the suppression of undesired spatial frequencies from the refractive index profiles, are described. A new, extremely simple antireflection coating synthesis method based on this concept is proposed.

© 1995 Optical Society of America

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