Abstract

Microlenses can be generated with various fabrication technologies. Some of these technologies cause large spherical aberrations in the resulting microlenses. We describe an algorithm based on Rayleigh’s quarter-wave criterion, which allows the evaluation of lens parameters for those microlenses. Specifically, we investigate numerical aperture, focal length, and space–bandwidth product with respect to applications in optical microsystems. We apply our algorithm to different types of microlenses, three gradient-index lenses, and one surface-relief lens. The experimental results demonstrate that our algorithm provides a helpful characterization method for microlenses with large aberrations.

© 1995 Optical Society of America

Gradient-index microlenses: numerical investigation of different spherical index profiles with the wave propagation method

Wolfgang Singer, Markus Testorf, and Karl-Heinz Brenner
Appl. Opt. 34(13) 2165-2171 (1995)

Selfoc microlens with a spherical surface

N. Yamamoto, H. Nishi, K. Nishizawa, and I. Kitano
Appl. Opt. 21(6) 1021-1023 (1982)

Index-distributed planar microlenses for three-dimensional micro-optics fabricated by silver-sodium ion exchange in BGG35 substrates

J. Bähr, K.-H. Brenner, S. Sinzinger, T. Spick, and M. Testorf
Appl. Opt. 33(25) 5919-5924 (1994)

Colorless gradient-index cylindrical lenses with high numerical apertures produced by silver-ion exchange

Bernhard Messerschmidt, Torsten Possner, and Rolf Goering
Appl. Opt. 34(34) 7825-7830 (1995)

Refractive and diffractive properties of planar micro-optical elements

M. Rossi, R. E. Kunz, and H. P. Herzig
Appl. Opt. 34(26) 5996-6007 (1995)