Abstract

The optical behavior of a thin film, that is, peak positions and intensities, is discussed for transmission under a thin-film approximation. The infrared transmission spectra of thin films, both standing films and those on dielectric substrates, are simulated for s and p polarization at various angles of incidence. For spectral simulation, the matrix method is used in conjunction with noise-free complex refractive indices based on the dispersion theory. The peak positions in the simulated spectra are compared with transverse optic and longitudinal optic frequencies based on the macroscopic theory. The simulated peak intensities for the standing films are compared with the prediction based on the thin-film approximation. Furthermore, it is found from the spectral simulation for thin films on dielectric substrates that the peak intensity for a thin film may depend on the thickness and refractive index of the substrate.

© 1995 Optical Society of America

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