Abstract

The damage thresh olds of five different types of quartz glass used for the production of spectroscopic cuvettes for liquids were determined with single temporal and spatial mode nanosecond pulses at 532 nm. One of the glasses had a damage threshold of ≃420 J/cm2, which was more than twice that of the other glasses.

© 1995 Optical Society of America

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References

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  1. K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
    [CrossRef]
  2. J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
    [CrossRef]
  3. D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).
  4. T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
    [CrossRef]
  5. L. D. Merkle, M. Bass, R. T. Swimm, “Multiple pulse laser-induced bulk damage in crystalline and fused quartz,” Natl. Bur. Stand. Spec. Publ. 669 (National Bureau of Standards, Washington, D.C., 1982), pp. 50–59.
  6. D. J. Krajnovich, I. K. Pour, “Long-term effects of pulsed KrF laser radiation on crystalline and amorphous SiO2,” in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 2114, 55–68 (1993).
  7. M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.
  8. NSG Precision Cells, Inc., 195 G Central Ave., Farmingdale, New York 11735.
  9. M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, “High sensitivity, single beam n2 measurement,” Opt. Lett. 14, 955–957 (1989).
    [CrossRef] [PubMed]
  10. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
    [CrossRef]
  11. D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
    [CrossRef]
  12. M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).
  13. A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

1993 (2)

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

1992 (2)

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
[CrossRef]

1990 (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

1989 (2)

M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, “High sensitivity, single beam n2 measurement,” Opt. Lett. 14, 955–957 (1989).
[CrossRef] [PubMed]

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

Bartoli, F. J.

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

Bass, M.

L. D. Merkle, M. Bass, R. T. Swimm, “Multiple pulse laser-induced bulk damage in crystalline and fused quartz,” Natl. Bur. Stand. Spec. Publ. 669 (National Bureau of Standards, Washington, D.C., 1982), pp. 50–59.

Canto, E.

M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.

Coulter, D. R.

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Griscom, D. L.

M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.

Hagan, D. J.

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Henningsen, T.

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

Krajnovich, D. J.

D. J. Krajnovich, I. K. Pour, “Long-term effects of pulsed KrF laser radiation on crystalline and amorphous SiO2,” in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 2114, 55–68 (1993).

Mansour, K.

K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
[CrossRef]

Mansour, N.

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.

Merkle, L. D.

L. D. Merkle, M. Bass, R. T. Swimm, “Multiple pulse laser-induced bulk damage in crystalline and fused quartz,” Natl. Bur. Stand. Spec. Publ. 669 (National Bureau of Standards, Washington, D.C., 1982), pp. 50–59.

Miskowski, V. M.

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Perry, J. W.

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Pong, R. G. S.

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

Pour, I. K.

D. J. Krajnovich, I. K. Pour, “Long-term effects of pulsed KrF laser radiation on crystalline and amorphous SiO2,” in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 2114, 55–68 (1993).

Said, A. A.

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, “High sensitivity, single beam n2 measurement,” Opt. Lett. 14, 955–957 (1989).
[CrossRef] [PubMed]

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

Sence, M. J.

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

Sheik-Bahae, M.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, “High sensitivity, single beam n2 measurement,” Opt. Lett. 14, 955–957 (1989).
[CrossRef] [PubMed]

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

Shirk, J. S.

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

Singh, N. B.

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

Snow, A. W.

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

Soileau, M. J.

K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
[CrossRef]

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.

Swimm, R. T.

L. D. Merkle, M. Bass, R. T. Swimm, “Multiple pulse laser-induced bulk damage in crystalline and fused quartz,” Natl. Bur. Stand. Spec. Publ. 669 (National Bureau of Standards, Washington, D.C., 1982), pp. 50–59.

Van Stryland, E. W.

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
[CrossRef]

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

M. Sheik-Bahae, A. A. Said, E. W. Van Stryland, “High sensitivity, single beam n2 measurement,” Opt. Lett. 14, 955–957 (1989).
[CrossRef] [PubMed]

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Wei, T. H.

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

Williams, W. E.

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

Xia, T.

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

Appl. Phys. B (1)

T. H. Wei, D. J. Hagan, M. J. Sence, E. W. Van Stryland, J. W. Perry, D. R. Coulter, “Direct measurements of nonlinear absorption and refraction in solutions of phthalocyanines,” Appl. Phys. B 54, 46–51 (1992).
[CrossRef]

Appl. Phys. Lett. (1)

J. S. Shirk, R. G. S. Pong, F. J. Bartoli, A. W. Snow, “Optical limiter using a lead phthalocyanine,” Appl. Phys. Lett. 63, 1880–1882 (1993).
[CrossRef]

IEEE J. Quantum Electron. (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Int. J. Nonlinear Opt. Phys. (1)

D. J. Hagan, T. Xia, A. A. Said, T. H. Wei, E. W. Van Stryland, “High dynamic range passive optical limiters,” Int. J. Nonlinear Opt. Phys. 2, 483–501 (1993).
[CrossRef]

J. Opt. Soc. B (1)

K. Mansour, M. J. Soileau, E. W. Van Stryland, “Nonlinear optical properties of carbon black suspensions,” J. Opt. Soc. B 9, 1100–1109 (1992).
[CrossRef]

Opt. Eng. (1)

M. J. Soileau, W. E. Williams, N. Mansour, E. W. Van Stryland, “Laser-induced damage and the role of self-focusing,” Opt. Eng. 8, 1133–1144 (1989).

Opt. Lett. (1)

Other (6)

D. R. Coulter, V. M. Miskowski, J. W. Perry, T. H. Wei, E. W. Van Stryland, D. J. Hagan, “Optical limiting in solutions of metallo-phthalocyanines and naphthalocyanines,” in Optical Technology for Microwave Applications IV, S. Yao, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1105, 42–51 (1989).

L. D. Merkle, M. Bass, R. T. Swimm, “Multiple pulse laser-induced bulk damage in crystalline and fused quartz,” Natl. Bur. Stand. Spec. Publ. 669 (National Bureau of Standards, Washington, D.C., 1982), pp. 50–59.

D. J. Krajnovich, I. K. Pour, “Long-term effects of pulsed KrF laser radiation on crystalline and amorphous SiO2,” in Laser-Induced Damage in Optical Materials: 1993, H. E. Bennett, L. L. Chase, A. H. Guenther, B. E. Newnam, M. J. Soileau, eds., Proc. Soc. Photo-Opt. Instrum. Eng. 2114, 55–68 (1993).

M. J. Soileau, N. Mansour, E. Canto, D. L. Griscom, “Effects of radiation induced defects on laser-induced breakdown in SiO2,” Natl. Bur. Stand. Spec. Publ. 746 (National Bureau of Standards, Washington, D.C., 1985), pp. 486–496.

NSG Precision Cells, Inc., 195 G Central Ave., Farmingdale, New York 11735.

A. A. Said, M. Sheik-Bahae, M. J. Soileau, E. W. Van Stryland, N. B. Singh, T. Henningsen, “Laser-induced damage to thallium arsenic selenide (TAS),” in Laser Induced Damage in Optical Materials, H. E. Bennet, L. L. Chase, A. H. Guenther, B. E. Newman, M. J. Soileau, eds., NIST Spec. Publ. 801 (National Institute of Standards and Technology, Gaithersburg, Md., 1989), pp. 84–87.

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Figures (2)

Fig. 1
Fig. 1

Experimental setup: the ratio (D 2/D 1) is measured versus sample position Z.

Fig. 2
Fig. 2

Typical damage data on sample ED-C, where the sample shows no damage at 152 μJ (circles) but is damaged at 165 μJ (squares).

Tables (2)

Tables Icon

Table 1 Damage Threshold of Fused-Quartz Windows

Tables Icon

Table 2 Manufacturing Methods of Fused-Quartz Samples

Metrics