Abstract

One of the many calibrations performed for a scientific-quality spectrometer is the characterization of its scattered-light properties. The scattered light can arise from any optical surface, and light leaks or scattering from baffles can also contribute to the instrumental stray-light level. For a diffraction-grating spectrometer the primary contribution to instrumental scattered light has been found to be the scattered light from the grating. The results from measuring the scattered-light properties of 10 diffraction gratings are discussed along with the application of these results in analyzing the total scattered light measured for three spectrometers. It has been found from these measurements that there are two components of the grating scattered light: a Lorentzian-type component and a constant background component. The Lorentzian component is predicted from the diffraction theory for a grating, and the constant background component is consistent with Rayleigh scattering from the microscopic surface imperfections. It was also discovered that multiple replicas of gratings from the same master grating exhibit significantly more scattered light than the preceding replica by factors of 1.1–2.

© 1994 Optical Society of America

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