Abstract

A new analysis technique for the automatic measurement of a three-dimensional object shape is proposed and verified experimentally. In this structured-light technique the process of projecting a grating pattern upon the object is considered for using carrier frequencies to modulate the object spectrum in the spatial frequency domain or to add a reference surface to the data in the space domain. The projected fringes are considered as interferometric fringes; therefore the interferogram analysis technique can be introduced into the measurement of a three-dimensional object shape.

© 1993 Optical Society of America

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