Márcia A. F. Destro, Roberto A. Stempniak, and Alvaro J. Damião, "Optical and crystalline properties of PbF2 thin films," Appl. Opt. 32, 7106-7109 (1993)
The optical and crystalline properties of PbF2 thin films as a function of the substrate temperature during deposition have been studied; the other evaporation conditions were kept as constant as possible. Channel spectra, guided modes, and ellipsometry techniques were used for the analysis of the optical properties of the films. X-ray diffraction was used for the analysis of the crystalline structure.
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Refractive Index n1, Thickness t, Their Respective Deviation Δn1, and Δt of the Sample 242 Obtained by the Guided-Mode Technique
λ (nm)
n1
Δn1 (10−4)
t (nm)
Δt (nm)
632.8
1.7570
1.1
760.7
2.5
514.5
1.7749
2.6
759.6
1.7
496.5
1.7789
2.8
759.2
2.0
488.0
1.7809
2.9
759.2
2.1
476.5
1.7841
2.6
759.1
2.0
Table 2
Refractive Index n1, Absorption Coefficient ⊔1, and Thickness t Measurements for Sample 241 for Five Different Positions (Fig. 2) Obtained by Ellipsometry Measurements
With subroutine CNK,3 for which k1 ≠ 0.
With subroutine CND,3 for which k1 = 0.
Table 3
Results from Channel Spectra Measurements of Sample 242
Wavelength λi (nm)
Fringe Order Mi
Refractive Index n
Deviation Δn (10−2)
755
3.5
1.740
1.0
662
4.0
1.743
1.1
591
4.5
1.751
1.1
535
5.0
1.761
1.2
489
5.5
1.771
1.3
451
6.0
1.781
1.3
419
6.5
1.793
1.4
Table 4
Results from Guided-Mode Measurements of Various Samples
Sample
Deposition Rate Dt (nm/s)
Substrate Temperature Ts (°C)
Film Thickness t1 (nm)
Refractive Index n1
292
0.52
56.2
769.9
1.7589
212
2.16
49.5
836.4
1.7486
262
0.59
79.0
750.1
1.7581
232
0.76
87.5
763.4
1.7534
242
0.71
112.5
759.6
1.7570
252
0.61
125.5
757.9
1.7577
282
0.42
310.0
940.7
1.7564
Table 5
Refractive Index n1, Absorption Coefficient ⊔1, and Thickness t of Various Samples Obtained by Ellipsometry (EL), Guided Modes (GM), and Channel Spectra (CS)
Sample
Technique
n1
Δn1 (10−3)
κ1 (10−3)
Δκ1 (10−5)
t (nm)
Δt (nm)
CS
1.7343
13.0
—
—
729.4
4.2
241
GM
1.7571
0.16
—
—
729.4
4.2
EL
1.7571
0.16
3.68
4.5
732.1
0.1
CS
1.7472
11.0
—
—
759.6
2.4
242
GM
1.7570
0.11
—
—
759.6
2.4
EL
1.7570
0.10
0.0
0.0
767.1
0.1
CS
1.7506
8.50
—
—
772.9
2.5
243
GM
1.7572
0.10
—
—
772.9
2.5
EL
1.7570
0.10
0.0
0.0
780.9
0.2
CS
1.7633
12.0
—
—
724.9
3.9
251
GM
1.7586
0.24
—
—
724.9
3.9
EL
1.7584
0.24
36.45
7.5
705.4
0.3
CS
1.7518
16.0
—
—
757.9
5.9
252
GM
1.7577
0.31
—
—
757.9
5.9
EL
1.7577
0.31
0.0
0.0
776.1
0.2
CS
1.7565
19.0
—
—
800.0
7.5
253
GM
1.7576
0.41
—
—
800.0
7.5
EL
1.7570
0.41
0.0
0.0
804.1
0.2
Tables (5)
Table 1
Refractive Index n1, Thickness t, Their Respective Deviation Δn1, and Δt of the Sample 242 Obtained by the Guided-Mode Technique
λ (nm)
n1
Δn1 (10−4)
t (nm)
Δt (nm)
632.8
1.7570
1.1
760.7
2.5
514.5
1.7749
2.6
759.6
1.7
496.5
1.7789
2.8
759.2
2.0
488.0
1.7809
2.9
759.2
2.1
476.5
1.7841
2.6
759.1
2.0
Table 2
Refractive Index n1, Absorption Coefficient ⊔1, and Thickness t Measurements for Sample 241 for Five Different Positions (Fig. 2) Obtained by Ellipsometry Measurements
With subroutine CNK,3 for which k1 ≠ 0.
With subroutine CND,3 for which k1 = 0.
Table 3
Results from Channel Spectra Measurements of Sample 242
Wavelength λi (nm)
Fringe Order Mi
Refractive Index n
Deviation Δn (10−2)
755
3.5
1.740
1.0
662
4.0
1.743
1.1
591
4.5
1.751
1.1
535
5.0
1.761
1.2
489
5.5
1.771
1.3
451
6.0
1.781
1.3
419
6.5
1.793
1.4
Table 4
Results from Guided-Mode Measurements of Various Samples
Sample
Deposition Rate Dt (nm/s)
Substrate Temperature Ts (°C)
Film Thickness t1 (nm)
Refractive Index n1
292
0.52
56.2
769.9
1.7589
212
2.16
49.5
836.4
1.7486
262
0.59
79.0
750.1
1.7581
232
0.76
87.5
763.4
1.7534
242
0.71
112.5
759.6
1.7570
252
0.61
125.5
757.9
1.7577
282
0.42
310.0
940.7
1.7564
Table 5
Refractive Index n1, Absorption Coefficient ⊔1, and Thickness t of Various Samples Obtained by Ellipsometry (EL), Guided Modes (GM), and Channel Spectra (CS)
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