Abstract
This special issue contains a collection of papers describing results that were presented at the Second Topical Meeting on Soft-X-Ray Projection Lithography sponsored by the Optical Society of America and held 6–8 April 1992 in Monterey, California, along with several additional papers submitted after that meeting. These papers are being published in this collection to make them readily available to a larger audience than would normally occur with a proceedings and also to take advantage of the critical review process.
© 1993 Optical Society of America
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Andrzej W. Miziolek, S. Randolph Long, and David R. Crosley
Appl. Opt. 32(6) 793-793 (1993)
Natale M. Ceglio, Andrew M. Hawryluk, and Gary E. Sommargren
Appl. Opt. 32(34) 7050-7056 (1993)
James R. Leger and G. Michael Morris
Appl. Opt. 32(14) 2481-2482 (1993)