Abstract

The relative retardation Δ, the orientation of the main axis φ, the polarization-dependent loss angle Ψ, and the reciprocal and the nonreciprocal rotation angle ρ of optical components can be determined, in principle, by intracavity ellipsometry. The component under test is placed inside a phase-modulated cw laser, which causes a change in the beat frequency, beam polarization, and intensity. Using the diode-pumped Nd:YAG-laser ellipsometer, we demonstrate with our preliminary measurements of Δ and φ the feasibility and precision of intracavity ellipsometry for measuring optically anisotropic components.

© 1993 Optical Society of America

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