Abstract
The relative retardation Δ, the orientation of the main axis φ, the polarization-dependent loss angle Ψ, and the reciprocal and the nonreciprocal rotation angle ρ of optical components can be determined, in principle, by intracavity ellipsometry. The component under test is placed inside a phase-modulated cw laser, which causes a change in the beat frequency, beam polarization, and intensity. Using the diode-pumped Nd:YAG-laser ellipsometer, we demonstrate with our preliminary measurements of Δ and φ the feasibility and precision of intracavity ellipsometry for measuring optically anisotropic components.
© 1993 Optical Society of America
Full Article | PDF ArticleOSA Recommended Articles
Wolfgang Holzapfel, Ulrich Neuschaefer-Rube, Jan Christian Braasch, and Nejat Mahdavi
Appl. Opt. 46(9) 1416-1428 (2007)
Tatsuya Kumagai, Yusaku Tottori, Ryusuke Miyata, and Hiroshi Kajioka
Appl. Opt. 53(4) 720-726 (2014)
Muhammad K. Al-Qaisi and Taner Akkin
Opt. Express 16(17) 13032-13041 (2008)