Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Problems of controlling the optical thickness of infrared coatings during deposition

Not Accessible

Your library or personal account may give you access

Abstract

Special problems that influence the accuracy of controlling the optical thickness of infrared coatings during deposition are discussed.

© 1993 Optical Society of America

Full Article  |  PDF Article
More Like This
Deposition error compensation for optical multilayer coatings. II. Experimental results—sputtering system

Brian T. Sullivan and J. A. Dobrowolski
Appl. Opt. 32(13) 2351-2360 (1993)

Synthesis and research of the optimum conditions for the optical monitoring of non-quarter-wave multilayers

C. Grèzes-Besset, F. Chazallet, G. Albrand, and E. Pelletier
Appl. Opt. 32(28) 5612-5618 (1993)

Optical coatings deposited by reactive ion plating

Allan J. Waldorf, J. A. Dobrowolski, Brian T. Sullivan, and L. M. Plante
Appl. Opt. 32(28) 5583-5593 (1993)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (4)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.