Optimized design of an antireflection coating for textured silicon solar cells

Shu-Chung Chiao; Jiu-Lin Zhou; H. A. Macleod

doi:10.1364/AO.32.005557

Applied Optics
Vol. 32,
Issue 28,
pp. 5557-5560
(1993)
•https://doi.org/10.1364/AO.32.005557

Optimized design of an antireflection coating for textured silicon solar cells

Shu-Chung Chiao, Jiu-Lin Zhou, and H. A. Macleod

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Shu-Chung Chiao, Jiu-Lin Zhou, and H. A. Macleod, "Optimized design of an antireflection coating for textured silicon solar cells," Appl. Opt. 32, 5557-5560 (1993)

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Abstract

The short-circuit current density of a solar cell is used as a merit function to optimize solar cell antireflection coating designs. J_sc/J_max ratios reach 99%, even with a 10-nm-thick passivation layer.

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Material	Thickness (nm)	J_sc (mA/cm²)	J_sc/J_max (%)	Reference^a
SiO₂	98.54	35.25	99.74	14
TiO₂	57.06			13
SiO₂	96.01	35.23	99.69	15
Ta₂O₅	58.74
Al₂O₃	72.46	35.15	99.46	16
TiO₂	47.30
Al₂O₃	67.34	35.11	99.35
Ta₂O₅	46.35
MgF₂	107.67	35.15	99.46	17
ZnS	54.75			17

Passivation Thickness (nm)	SiO₂/TiO₂ J_sc/J_max (%)	SiO₂/Ta₂O₅ J_sc/J_max (%)	Al₂O₃/TiO₂ J_sc/J_max (%)	Al₂O₃/Ta₂O₅ J_sc/j_max (%)	MgF₂/ZnS J_sc/J_max (%)
0	99.74	99.69	99.46	99.35	99.46
10	99.68	99.61	99.34	99.18	99.46
20	99.46	99.35	98.81	98.71	99.34
30	99.01	98.87	98.74	97.89	99.03
40	98.30	98.15	96.70	96.82	98.48
50	97.38	97.24	98.06	95.61	97.74
			(Al₂O₃ only)

Material	Thickness (nm)	J_sc (mA/cm²)	J_sc/J_max (%)	Reference^a
SiO₂	98.54	35.25	99.74	14
TiO₂	57.06			13
SiO₂	96.01	35.23	99.69	15
Ta₂O₅	58.74
Al₂O₃	72.46	35.15	99.46	16
TiO₂	47.30
Al₂O₃	67.34	35.11	99.35
Ta₂O₅	46.35
MgF₂	107.67	35.15	99.46	17
ZnS	54.75			17

Passivation Thickness (nm)	SiO₂/TiO₂ J_sc/J_max (%)	SiO₂/Ta₂O₅ J_sc/J_max (%)	Al₂O₃/TiO₂ J_sc/J_max (%)	Al₂O₃/Ta₂O₅ J_sc/j_max (%)	MgF₂/ZnS J_sc/J_max (%)
0	99.74	99.69	99.46	99.35	99.46
10	99.68	99.61	99.34	99.18	99.46
20	99.46	99.35	98.81	98.71	99.34
30	99.01	98.87	98.74	97.89	99.03
40	98.30	98.15	96.70	96.82	98.48
50	97.38	97.24	98.06	95.61	97.74
			(Al₂O₃ only)

Abstract

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Equations (4)

Applied Optics