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Surface-roughness measurement using Fourier transformation of doubly scattered speckle pattern

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Abstract

The statistical properties of the doubly scattered speckle pattern generated from a rough surface, under a fully developed and static speckle pattern illumination, have been investigated by numerical analysis. The real-time Fourier transformation of the doubly scattered speckle pattern by an optical process enables us to measure the surface roughness in quasi real time.

© 1993 Optical Society of America

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