Abstract

A technique to measure linear diattenuation and retardance spectra of infrared materials in transmission is described. A sample is rotated between two stationary linear polarizers in the sample compartment of a Fourier transform infrared spectrometer. The intensity modulation that results from the rotation of the sample is Fourier analyzed, and the linear diattenuation and linear retardance of the sample are calculated from the Fourier series coefficients for each wavelength. The advantages of this technique include immunity of the measurement to instrumental polarization, to circular diattenuation, and to circular retardance. The rotating sample polarimeter does not require retarders. Compensation for systematic errors from polarizers with diattenuation less than one is included in the data reduction. This technique is useful for the calibration of retarders and polarizers and hence for the bootstrap calibration of more elaborate polarimeters such as Mueller matrix polarimeters. We present as an example of the technique the caliration spectra 3–14 μm of an infrared quasi-achromatic retarder whose fast axis orientation oscillates with wavelength.

© 1993 Optical Society of America

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Errata

David B. Chenault and Russell A. Chipman, "Measurements of linear diattenuation and linear retardation spectra with a rotating sample spectropolarimeter: erratum," Appl. Opt. 33, 1145-1145 (1994)
https://www.osapublishing.org/ao/abstract.cfm?uri=ao-33-7-1145

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