Abstract

An optimal metal–waυelength combination depends on the measuring principle of the surface-plasmon resonance (SPR) sensor. Silυer at 800 nm is the best for fixed-angle measurements.

© 1992 Optical Society of America

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References

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  1. R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
    [CrossRef]
  2. E. Kretschmann, “Die bestimmungen optischer Konstanten von Metallen durch Anregung van Oberflächen plasma-schwingungen,” Z. Phys. 241, 313–341 (1971).
    [CrossRef]
  3. H. E. de Bruijn, R. P. H. Kooyman, J. Greve, “Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment,” Appl. Opt. 29, 1974–1978 (1990).
    [CrossRef]
  4. E. M. Yeatman, E. A. Ash, “Surface plasmon scanning microscopy,” in Scanning Microscopy Technologies and Applications, E. C. Teague, ed., Proc. Soc. Photo-Opt. Instrum. Eng.897, 100–107 (1988).
  5. H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
    [CrossRef]
  6. G. Hass, “Optical properties of metals,” in American Institute of Physics Handbook, W. L. Wolfe, ed. (McGraw-Hill, New York, 1963).
  7. C. K. Hwangbo, L. J. Lingg, J. P. Lehan, H. A. Macleod, J. L. Makous, S. Y. Kim, “Ion assisted deposition of thermally evaporated Ag and Al films,” Appl. Opt. 28, 2769–2778 (1989).
    [CrossRef] [PubMed]

1991

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

1990

1989

1988

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

1971

E. Kretschmann, “Die bestimmungen optischer Konstanten von Metallen durch Anregung van Oberflächen plasma-schwingungen,” Z. Phys. 241, 313–341 (1971).
[CrossRef]

Altenburg, B. S. F.

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

Ash, E. A.

E. M. Yeatman, E. A. Ash, “Surface plasmon scanning microscopy,” in Scanning Microscopy Technologies and Applications, E. C. Teague, ed., Proc. Soc. Photo-Opt. Instrum. Eng.897, 100–107 (1988).

de Bruijn, H. E.

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

H. E. de Bruijn, R. P. H. Kooyman, J. Greve, “Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment,” Appl. Opt. 29, 1974–1978 (1990).
[CrossRef]

Greve, J.

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

H. E. de Bruijn, R. P. H. Kooyman, J. Greve, “Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment,” Appl. Opt. 29, 1974–1978 (1990).
[CrossRef]

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

Hass, G.

G. Hass, “Optical properties of metals,” in American Institute of Physics Handbook, W. L. Wolfe, ed. (McGraw-Hill, New York, 1963).

Hwangbo, C. K.

Kim, S. Y.

Kolkman, H.

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

Kooyman, R. P. H.

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

H. E. de Bruijn, R. P. H. Kooyman, J. Greve, “Determination of dielectric permittivity and thickness of a metal layer from a surface plasmon resonance experiment,” Appl. Opt. 29, 1974–1978 (1990).
[CrossRef]

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

Kretschmann, E.

E. Kretschmann, “Die bestimmungen optischer Konstanten von Metallen durch Anregung van Oberflächen plasma-schwingungen,” Z. Phys. 241, 313–341 (1971).
[CrossRef]

Lehan, J. P.

Lingg, L. J.

Macleod, H. A.

Makous, J. L.

van Gent, J.

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

Yeatman, E. M.

E. M. Yeatman, E. A. Ash, “Surface plasmon scanning microscopy,” in Scanning Microscopy Technologies and Applications, E. C. Teague, ed., Proc. Soc. Photo-Opt. Instrum. Eng.897, 100–107 (1988).

Anal. Chim. Acta

R. P. H. Kooyman, H. Kolkman, J. van Gent, J. Greve, “Surface plasmon resonance immunosensors: sensitivity considerations,” Anal. Chim. Acta 213, 35–45 (1988).
[CrossRef]

Appl. Opt.

Opt. Commun.

H. E. de Bruijn, B. S. F. Altenburg, R. P. H. Kooyman, J. Greve, “Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance,” Opt. Commun. 82, 425–432 (1991).
[CrossRef]

Z. Phys.

E. Kretschmann, “Die bestimmungen optischer Konstanten von Metallen durch Anregung van Oberflächen plasma-schwingungen,” Z. Phys. 241, 313–341 (1971).
[CrossRef]

Other

G. Hass, “Optical properties of metals,” in American Institute of Physics Handbook, W. L. Wolfe, ed. (McGraw-Hill, New York, 1963).

E. M. Yeatman, E. A. Ash, “Surface plasmon scanning microscopy,” in Scanning Microscopy Technologies and Applications, E. C. Teague, ed., Proc. Soc. Photo-Opt. Instrum. Eng.897, 100–107 (1988).

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Figures (2)

Fig. 1
Fig. 1

(a) Basic equipment: light from a He–Ne laser, 1, is reflected at the metal layer (black) in a prism, 2, and the reflection coefficient is measured by the detector, 3, or the reflected beam is magnified with a lens and the metal interface is imaged on a screen, 4. A dielectric layer is present (white) on top of the metal layer. (b) The angle-dependent reflection coefficient for SPR. θp is the plasmon angle; θc is the fixed angle for which reflection changes can be measured.

Fig. 2
Fig. 2

Definition of the layer characteristics dj and ∊j. The dielectric constants of the prism and dielectric and bulk material are taken as real, which means that nonabsorbing materials are used.

Tables (1)

Tables Icon

Table I Sensitivities of S and S ˜ for Different Metals

Equations (8)

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S = ( d R d θ d θ d d 3 ) θ=θ c d R d θ d θ p d d 3 ,
S = d R d k x d k p d d 3 ,
S * = d θ p d d 3 E = d θ p d k p d k p d d 3 E = S ˜ · E ,
Δ k 1 / 2 = 2 ( Γ i + Γ rad ) .
Δ k 1 / 2 Γ i = 2 π λ ( 4 r r 4 ) 3 / 2 i 2 r 2 .
Δ k p = ( 2 π λ ) 2 ( r 4 ) 3 / 2 ( r 4 ) 2 Δ d 3 3 ( 3 4 ) ,
d k p d d 3 r 3 / 2 λ 2 ( r 4 ) 2 , d θ p d k p = λ 2 π n 1 cos θ p ,
S = d R d k x d k p d d 3 ( κ 2 η 2 ) 3 / 2 ληκ , S ˜ = d θ p d k p d k p d d 3 1 λ ( κ 2 η 2 ) 1 / 2 .

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