Abstract

A computer-controlled Mueller matrix polarimeter with dual rotating retarders is described. Bulk properties of optical materials are determined by controlling the input-polarization state and measuring the output-polarization state. The Mueller matrix of a sample is obtained from polarimetric measurements, and polarization properties, i.e., diattenuation and retardance as well as depolarization, are extracted from the Mueller matrix. Further, fundamental electro- and magneto-optical material properties such as the electro-optical tensor coefficients may be obtained from Mueller matrices measured with applied fields. The polarimeter is currently configured to operate over the 3- to 12-μm spectral region.

© 1992 Optical Society of America

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