Abstract

The temperature dependence of the IR interference filters that use lead telluride as a high-index material is measured at various temperatures. Experimental results show that the wavelength and transmission shifts are dominated by the absorption edge and index of refraction of lead telluride, respectively, depending on where the transmission spectrum of the filter is located.

© 1992 Optical Society of America

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References

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  1. M. L. Baker, V. L. Yen, “Effects of the variation of angle of incidence and temperature on infrared filter characteristics,” Appl. Opt. 6, 1343–1351 (1967).
    [CrossRef] [PubMed]
  2. G. J. Hawkins, J. S. Seeley, R. Hunneman, “Spectral characterization of cooled filters for remote sensing,” in Recent Developments in Infrared Components and Subsystems, C. T. Elliott, ed., Proc. Soc. Photo-Opt. Instrum. Eng.915, 71–78 (1988).
  3. J. S. Seeley, R. Hunneman, A. Whatley, “Measurement of infrared multilayer filters at a temperature down to 4 K,” in Optical Thin Films, R. I. Seedon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 180–183 (1982).
  4. D. L. Decker, V. A. Hodgkin, “Techniques of measurement of reflectance and transmittance of thin film coatings as a function of temperature,” in Optical Thin Films, R. I. Seddon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 167–174 (1982).

1967 (1)

Baker, M. L.

Decker, D. L.

D. L. Decker, V. A. Hodgkin, “Techniques of measurement of reflectance and transmittance of thin film coatings as a function of temperature,” in Optical Thin Films, R. I. Seddon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 167–174 (1982).

Hawkins, G. J.

G. J. Hawkins, J. S. Seeley, R. Hunneman, “Spectral characterization of cooled filters for remote sensing,” in Recent Developments in Infrared Components and Subsystems, C. T. Elliott, ed., Proc. Soc. Photo-Opt. Instrum. Eng.915, 71–78 (1988).

Hodgkin, V. A.

D. L. Decker, V. A. Hodgkin, “Techniques of measurement of reflectance and transmittance of thin film coatings as a function of temperature,” in Optical Thin Films, R. I. Seddon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 167–174 (1982).

Hunneman, R.

G. J. Hawkins, J. S. Seeley, R. Hunneman, “Spectral characterization of cooled filters for remote sensing,” in Recent Developments in Infrared Components and Subsystems, C. T. Elliott, ed., Proc. Soc. Photo-Opt. Instrum. Eng.915, 71–78 (1988).

J. S. Seeley, R. Hunneman, A. Whatley, “Measurement of infrared multilayer filters at a temperature down to 4 K,” in Optical Thin Films, R. I. Seedon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 180–183 (1982).

Seeley, J. S.

J. S. Seeley, R. Hunneman, A. Whatley, “Measurement of infrared multilayer filters at a temperature down to 4 K,” in Optical Thin Films, R. I. Seedon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 180–183 (1982).

G. J. Hawkins, J. S. Seeley, R. Hunneman, “Spectral characterization of cooled filters for remote sensing,” in Recent Developments in Infrared Components and Subsystems, C. T. Elliott, ed., Proc. Soc. Photo-Opt. Instrum. Eng.915, 71–78 (1988).

Whatley, A.

J. S. Seeley, R. Hunneman, A. Whatley, “Measurement of infrared multilayer filters at a temperature down to 4 K,” in Optical Thin Films, R. I. Seedon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 180–183 (1982).

Yen, V. L.

Appl. Opt. (1)

Other (3)

G. J. Hawkins, J. S. Seeley, R. Hunneman, “Spectral characterization of cooled filters for remote sensing,” in Recent Developments in Infrared Components and Subsystems, C. T. Elliott, ed., Proc. Soc. Photo-Opt. Instrum. Eng.915, 71–78 (1988).

J. S. Seeley, R. Hunneman, A. Whatley, “Measurement of infrared multilayer filters at a temperature down to 4 K,” in Optical Thin Films, R. I. Seedon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 180–183 (1982).

D. L. Decker, V. A. Hodgkin, “Techniques of measurement of reflectance and transmittance of thin film coatings as a function of temperature,” in Optical Thin Films, R. I. Seddon, ed., Proc. Soc. Photo-Opt. Instrum. Eng.325, 167–174 (1982).

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Figures (2)

Fig. 1
Fig. 1

Measured variation of the spectral characteristic of a cuton/cutoff bandpass filter.

Fig. 2
Fig. 2

Measured variation of the spectral characteristic of a low-pass filter with a change in temperature.

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