Abstract

A new fiber pigtailed optical receiver design using a single gradient-index rod lens with a beveled exit face achieved a broadband optical return loss of >65 dB, which was limited by the diffuse reflection from the photodetector front surface. By contrast the optical return loss for a receiver with an unbeveled lens exit face and an on-axis optical path was limited to a smaller value by the specular reflection from the lens exit face.

© 1992 Optical Society of America

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  6. Nippon Sheet Glass Company, Ltd., Tokyo, Japan.
  7. Selfoc is a registered trade name of the Nippon Sheet Glass Company, Ltd., Tokyo, Japan.
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    [CrossRef] [PubMed]
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    [CrossRef]
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1989 (1)

D. M. Braun, K. W. Leyde, “Optical reflection measurement system using a swept modulation frequency technique,” Opt. Eng. 28, 286–289 (1989).

1988 (1)

1987 (3)

1986 (1)

J. E. Bowers, C. A. Burrus, F. Mitschke, “Millimetre-waveguide-mounted InGaAs photodetectors,” Electron. Lett. 22, 633–635 (1986)
[CrossRef]

1985 (1)

R. W. Tkach, A. R. Chraplyvy, “Linewidth broadening and mode spliting due to weak feedback in single-frequency 1.5 μm lasers,” Electron. Lett. 21, 1081–1083 (1985).
[CrossRef]

1984 (1)

1980 (1)

1975 (1)

Agrawal, G. P.

G. P. Agrawal, N. K. Dutta, Long Wavelength Semiconductor Lasers (Van Nostrand Reinhold, New York, 1986).

Bowers, J. E.

J. E. Bowers, C. A. Burrus, F. Mitschke, “Millimetre-waveguide-mounted InGaAs photodetectors,” Electron. Lett. 22, 633–635 (1986)
[CrossRef]

Braun, D. M.

D. M. Braun, K. W. Leyde, “Optical reflection measurement system using a swept modulation frequency technique,” Opt. Eng. 28, 286–289 (1989).

D. M. Braun, “Design of single layer antireflection coatings for InP/In0.53Ga0.47As/InP photodetectors for the 1200–1600-nm wavelength range,” Appl. Opt. 27, 2006–2011 (1988).
[CrossRef] [PubMed]

Burrus, C. A.

J. E. Bowers, C. A. Burrus, F. Mitschke, “Millimetre-waveguide-mounted InGaAs photodetectors,” Electron. Lett. 22, 633–635 (1986)
[CrossRef]

Carr, S.

Chida, K.

Chraplyvy, A. R.

R. W. Tkach, A. R. Chraplyvy, “Linewidth broadening and mode spliting due to weak feedback in single-frequency 1.5 μm lasers,” Electron. Lett. 21, 1081–1083 (1985).
[CrossRef]

Danielson, B. L.

Davies, D. E. N.

Dutta, N. K.

G. P. Agrawal, N. K. Dutta, Long Wavelength Semiconductor Lasers (Van Nostrand Reinhold, New York, 1986).

Leyde, K. W.

D. M. Braun, K. W. Leyde, “Optical reflection measurement system using a swept modulation frequency technique,” Opt. Eng. 28, 286–289 (1989).

Marcuse, D.

Mette, W.

Mitschke, F.

J. E. Bowers, C. A. Burrus, F. Mitschke, “Millimetre-waveguide-mounted InGaAs photodetectors,” Electron. Lett. 22, 633–635 (1986)
[CrossRef]

Noda, J.

Rashleigh, S. C.

Sakowski, H.

Schmidthaus, W.

Takada, K.

Tkach, R. W.

R. W. Tkach, A. R. Chraplyvy, “Linewidth broadening and mode spliting due to weak feedback in single-frequency 1.5 μm lasers,” Electron. Lett. 21, 1081–1083 (1985).
[CrossRef]

Ulrich, R.

von Bally, G.

Whittenberg, C. D.

Yokohama, I.

Youngquist, R. C.

Appl. Opt. (6)

Electron. Lett. (2)

R. W. Tkach, A. R. Chraplyvy, “Linewidth broadening and mode spliting due to weak feedback in single-frequency 1.5 μm lasers,” Electron. Lett. 21, 1081–1083 (1985).
[CrossRef]

J. E. Bowers, C. A. Burrus, F. Mitschke, “Millimetre-waveguide-mounted InGaAs photodetectors,” Electron. Lett. 22, 633–635 (1986)
[CrossRef]

Opt. Eng. (1)

D. M. Braun, K. W. Leyde, “Optical reflection measurement system using a swept modulation frequency technique,” Opt. Eng. 28, 286–289 (1989).

Opt. Lett. (1)

Other (3)

G. P. Agrawal, N. K. Dutta, Long Wavelength Semiconductor Lasers (Van Nostrand Reinhold, New York, 1986).

Nippon Sheet Glass Company, Ltd., Tokyo, Japan.

Selfoc is a registered trade name of the Nippon Sheet Glass Company, Ltd., Tokyo, Japan.

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