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Two-wavelength electronic speckle-pattern interferometry for the analysis of discontinuous deformation fields

G. Gülker, O. Haack, K. D. Hinsch, C. Hölscher, J. Kuls, and W. Platen

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Abstract

Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.

© 1992 Optical Society of America

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