Abstract

A method is presented for measuring the modulation transfer function of signal processing in the element (SPRITE) detectors with a HgCdTe composition optimized for the 3–5-μm band. This method incorporates a 3.39-μm He–Ne laser to generate Young’s fringes of varying spatial frequency, which are scanned across the detector elements. The results are consistent with theoretical models for these devices and indicate a limited resolution capability for SPRITE detectors used for the 3–5-μm band.

© 1992 Optical Society of America

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References

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  1. C. T. Elliott, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981).
    [CrossRef]
  2. C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
    [CrossRef]
  3. D. Day, T. J. Shepherd, “Transport in photo-conductors—I,” Solid State Electron. 25, 707–712 (1982).
    [CrossRef]
  4. G. Boreman, A. Plogstedt, “Modulation transfer function and number of equivalent elements for SPRITE detectors,” Appl. Opt. 27, 4331–4335 (1988).
    [CrossRef] [PubMed]
  5. G. Boreman, A. Plogstedt, “Spatial filtering by a line-scanned nonrectangular detector: application to SPRITE readout MTF,” Appl. Opt. 28, 1165–1168 (1989).
    [CrossRef] [PubMed]
  6. T. Shepherd, D. Day, “Transport in photo-conductors—II,” Solid State Electron. 25, 713–718 (1982).
    [CrossRef]
  7. T. Ashley, C. Elliot, “Accumulation effects at contacts to n-type cadmium-mercury-telluride photoconductors,” Infrared Phys. 22, 367–376 (1982).
    [CrossRef]
  8. T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
    [CrossRef]
  9. S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. (London) 228, 63–66 (1983).
  10. B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

1989 (1)

1988 (1)

1984 (1)

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

1983 (1)

S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. (London) 228, 63–66 (1983).

1982 (4)

T. Shepherd, D. Day, “Transport in photo-conductors—II,” Solid State Electron. 25, 713–718 (1982).
[CrossRef]

T. Ashley, C. Elliot, “Accumulation effects at contacts to n-type cadmium-mercury-telluride photoconductors,” Infrared Phys. 22, 367–376 (1982).
[CrossRef]

C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
[CrossRef]

D. Day, T. J. Shepherd, “Transport in photo-conductors—I,” Solid State Electron. 25, 707–712 (1982).
[CrossRef]

1981 (1)

C. T. Elliott, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981).
[CrossRef]

Anderson, B. K.

B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

Ashley, T.

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

T. Ashley, C. Elliot, “Accumulation effects at contacts to n-type cadmium-mercury-telluride photoconductors,” Infrared Phys. 22, 367–376 (1982).
[CrossRef]

Barnard, K. J.

B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

Boreman, G.

Boreman, G. D.

B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

Braim, S. P.

S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. (London) 228, 63–66 (1983).

Campbell, A. P.

S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. (London) 228, 63–66 (1983).

Day, D.

T. Shepherd, D. Day, “Transport in photo-conductors—II,” Solid State Electron. 25, 713–718 (1982).
[CrossRef]

D. Day, T. J. Shepherd, “Transport in photo-conductors—I,” Solid State Electron. 25, 707–712 (1982).
[CrossRef]

C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
[CrossRef]

Elliot, C.

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

T. Ashley, C. Elliot, “Accumulation effects at contacts to n-type cadmium-mercury-telluride photoconductors,” Infrared Phys. 22, 367–376 (1982).
[CrossRef]

Elliot, C. T.

C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
[CrossRef]

Elliott, C. T.

C. T. Elliott, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981).
[CrossRef]

Johns, M.

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

Plogstedt, A.

Plogstedt, A. E.

B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

Shepherd, T.

T. Shepherd, D. Day, “Transport in photo-conductors—II,” Solid State Electron. 25, 713–718 (1982).
[CrossRef]

Shepherd, T. J.

D. Day, T. J. Shepherd, “Transport in photo-conductors—I,” Solid State Electron. 25, 707–712 (1982).
[CrossRef]

White, A.

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

Wilson, D. J.

C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
[CrossRef]

Wotherspoon, J.

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

Appl. Opt. (2)

Electron. Lett. (1)

C. T. Elliott, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981).
[CrossRef]

IEE Conf. Publ. (London) (1)

S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. (London) 228, 63–66 (1983).

Infrared Phys. (3)

T. Ashley, C. Elliot, “Accumulation effects at contacts to n-type cadmium-mercury-telluride photoconductors,” Infrared Phys. 22, 367–376 (1982).
[CrossRef]

T. Ashley, C. Elliot, A. White, J. Wotherspoon, M. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
[CrossRef]

C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982).
[CrossRef]

Solid State Electron. (2)

D. Day, T. J. Shepherd, “Transport in photo-conductors—I,” Solid State Electron. 25, 707–712 (1982).
[CrossRef]

T. Shepherd, D. Day, “Transport in photo-conductors—II,” Solid State Electron. 25, 713–718 (1982).
[CrossRef]

Other (1)

B. K. Anderson, G. D. Boreman, K. J. Barnard, A. E. Plogstedt, “SPRITE detector characterization through impulse response testing,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Hoist, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, (to be published).

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Figures (7)

Fig. 1
Fig. 1

SPRITE detector geometry.

Fig. 2
Fig. 2

Measurement setup.

Fig. 3
Fig. 3

Typical detector output signal with scanned fringe input.

Fig. 4
Fig. 4

Photograph of 700-μum SPRITE detectors with bifurcated readouts.

Fig. 5
Fig. 5

Photograph of various-length SPRITE detectors (450–650 μm) with tapered readouts.

Fig. 6
Fig. 6

Measured and theoretical MTF of 400-μm (tapered readout) and 700-μm (bifurcated readout) SPRITE detectors.

Fig. 7
Fig. 7

Measured and theoretical MTF of 450-μm and 550-μm SPRITE detectors with tapered readouts.

Tables (1)

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Table I Values Used In Calculation of Theoretical MTF

Equations (4)

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υ a = μ a E ,
MTF d ( ξ , L ) = 1 exp { [ L D 2 ( 2 πξ ) 2 + 1 ] L μ E τ } [ L D 2 ( 2 πξ ) 2 + 1 ] { 1 exp [ ( L μ E τ ) ] } ,
MTF r ( ξ ) = F [ rect ( x X / 2 X ) exp ( α x ) ] .
MTF = MTF d × MTF r .

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