Abstract

An automated interferometer for primary calibration of gauge blocks is described that requires no prior knowledge of the gauge length. For short gauge blocks, the results agree with previous calibrations to within 10 nm.

© 1991 Optical Society of America

Full Article  |  PDF Article
More Like This
Arm-length measurement of an interferometer using the optical-frequency-scanning technique

Yucong Zhu, Hirokazu Matsumoto, and Tadanao O'ishi
Appl. Opt. 30(25) 3561-3562 (1991)

Absolute length calibration of gauge blocks using optical comb of a femtosecond pulse laser

Jonghan Jin, Young-Jin Kim, Yunseok Kim, Seung-Woo Kim, and Chu-Shik Kang
Opt. Express 14(13) 5968-5974 (2006)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription