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Electron micrography and x-ray study of dip-lacquered LiF (220)

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Abstract

It has been proposed to use the 220 reflection of LiF with a multilayer deposited upon the top for simultaneous spectroscopy near Fe-k and O-k and below the C-k absorption edge (284 eV) in x-ray astronomy. We demonstrate that a substantial reduction of surface roughness is obtained by dip lacquering state-of-the-art polished LiF(220) surfaces. Using a microdensitometer analysis of electron micrographs of surface replicas and x-ray reflection, we have measured ∼10-Å rms roughness of Au-coated dip-lacquered LiF(220) crystals, as opposed to ∼60 Å measured on the bare LiF(220) crystal surface.

© 1991 Optical Society of America

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