Abstract

In a glass–metal–dielectric system, it is normally impossible to determine simultaneously the complex dielectric constant, the thickness of the metal, and the corresponding parameters of a dielectric overlayer. We propose the use of the pseudo-Brewster or Abelès angle as an additional parameter to characterize simultaneously a dielectric thin-film overcoating and the metal surface parameters. We use a Kretschmann attenuated-total-reflection configuration. An admittance diagram is used to illustrate graphically the role of an absentee layer at this angle. A study of the limitations of the method is also presented.

© 1991 Optical Society of America

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