Abstract

We describe procedures for measuring retardation, the uniformity of retardation, and optical axis alignment of birefringent crystals.

© 1991 Optical Society of America

Full Article  |  PDF Article
More Like This
Method for measuring the retardation of a wave plate

Lih-Horng Shyu, Chieh-Li Chen, and Der-Chin Su
Appl. Opt. 32(22) 4228-4230 (1993)

Simple method of measuring the duration of short laser pulses

Isabel Cañete, Yves Verbandt, and Jean Louis Coutaz
Appl. Opt. 30(15) 1885-1886 (1991)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (4)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Metrics