Abstract

When a recording microdensitometer is used for evaluating the image quality of a photographic material, the inherent transfer characteristics of the microdensitometer itself must be considered. The theoretica analysis and evaluation of the transient response of the system in space was performed with an IBM 162 computer. The computed analysis involved the convolution of the transient response of the variou optical elements utilized in the microdensitometer. Comparison of the theoretically computed result with the experimental knife-edge scans indicated the need for separate consideration of the high-and low-density responses. Good agreement was established between the evaluation of physical knife edges on a microdensitometer and the computed theoretical performance response for that instrument. These results indicate that the basic microdensitometer system approaches a diffraction-limited response. Certain secondary effects are also discussed.

© 1964 Optical Society of America

Practical Tests of a Microdensitometer System

W. N. Charman
Appl. Opt. 4(3) 289-294 (1965)

Bilinear system analysis for microdensitometers

Y. Sheng and J. Duvernoy
J. Opt. Soc. Am. A 3(8) 1320-1325 (1986)

Elimination of Microdensitometer Degradation from Scans of Photographic Images

Robert A. Jones and John F. Coughlin
Appl. Opt. 5(9) 1411-1414 (1966)

Methods for Engineering Photographic Systems

George C. Higgins
Appl. Opt. 3(1) 1-10 (1964)

Noise power spectrum analysis of a scanning microdensitometer

Phillip C. Bunch and Richard Van Metter
Appl. Opt. 27(16) 3468-3474 (1988)