Abstract

A new type of differential interferometer based on holographic optical elements is developed which allows a refractive index gradient field to be determined in two orthogonal directions obtained sequentially with a PLZT electrooptic modulator. The sign of the gradient is unequivocally determined by using a reference fringe pattern added to the interferogram. The sensitivity of the device is easily adjustable by changing the position of only one optical component.

© 1990 Optical Society of America

Differential phase quadrature surface profiling interferometer

Basil A. Omar, Alan J. Holloway, and David C. Emmony
Appl. Opt. 29(31) 4715-4719 (1990)

Tunable differential interferometer for optical tomography

Gregory W. Faris and Hans M. Hertz
Appl. Opt. 28(21) 4662-4667 (1989)

Grating interferometers for producing large holographic gratings

Robert R. Hershey and Emmett N. Leith
Appl. Opt. 29(7) 937-943 (1990)

Testing a zone plate with a grating interferometer

Jenn-An Lin, W. T. Yeh, and S. W. Hsu
Appl. Opt. 29(34) 5151-5158 (1990)

Optical limitations of the Maxwellian view interferometer

Larry N. Thibos
Appl. Opt. 29(10) 1411-1419 (1990)