Abstract

The instrument described is a newly designed reflectometer. Measurements are made with a polarized light beam as a function of wavelength and angle of incidence. Calibration tests have outlined the possibility of using the instrument for reflectance measurements on mirrors with good reproducibility (0.2%) and accuracy (better than 1%). This has been obtained by the alignment system of the sample and the absolute method used for the determination of its reflectance.

© 1990 Optical Society of America

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References

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  1. H. E. Bennett, W. F. Koehler, “Precision Measurement of Absolute Specular Reflectance with Minimized Systematic Errors,” J. Opt. Soc. Am. 50, 1–6 (1960).
    [CrossRef]
  2. K. Zander, “Gerät zur Messung Des Gerichteten Specktralen Reflexionsgrades ebener Flächen bei Senkrechtem Strahlungseinfall,” Feinwerktech. Messtech. 85, 401–402 (1977).
  3. R. B. Pettit, “Characterization of the Reflected Beam Profile of Solar Mirror Materials,” Sol. Energy 19, 733–741 (1977).
    [CrossRef]
  4. W. R. Weidner, J. J. Hsia, “NBS Specular Reflectometer–Spectrophotometer,” Appl. Opt. 19, 1268–1273 (1980).
    [CrossRef] [PubMed]
  5. K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).
  6. A. Bittar, J. D. Hamlin, “High-Accuracy True Normal-Incidence Absolute Reflectometer,” Appl. Opt. 23, 4054–4057 (1984).
    [CrossRef] [PubMed]
  7. L. Morren, “Quelques Observations Concernant la Mesure des Facteurs de Réfléction et de Trasmission,” Lux 134, 4–8 (1985).
  8. F. Petru, J. Krsek, “A Reflectometer for Measurements of Reflectivity of Dielectric Mirrors,” Opt. Acta 21, 293–314 (1974).
    [CrossRef]
  9. V. R. Weidner, J. J. Hsia, “Standard Reference Materials: Preparation and Calibration of First-Surface Aluminum Mirror Specular Reflectance Standards (Standard Reference Material 2003a),” Natl. Bur. Stand. U.S. Spec. Publ. 260-75 (May1982).

1985

L. Morren, “Quelques Observations Concernant la Mesure des Facteurs de Réfléction et de Trasmission,” Lux 134, 4–8 (1985).

1984

1982

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

V. R. Weidner, J. J. Hsia, “Standard Reference Materials: Preparation and Calibration of First-Surface Aluminum Mirror Specular Reflectance Standards (Standard Reference Material 2003a),” Natl. Bur. Stand. U.S. Spec. Publ. 260-75 (May1982).

1980

1977

K. Zander, “Gerät zur Messung Des Gerichteten Specktralen Reflexionsgrades ebener Flächen bei Senkrechtem Strahlungseinfall,” Feinwerktech. Messtech. 85, 401–402 (1977).

R. B. Pettit, “Characterization of the Reflected Beam Profile of Solar Mirror Materials,” Sol. Energy 19, 733–741 (1977).
[CrossRef]

1974

F. Petru, J. Krsek, “A Reflectometer for Measurements of Reflectivity of Dielectric Mirrors,” Opt. Acta 21, 293–314 (1974).
[CrossRef]

1960

Al-Marzouk, K.

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

Bennett, H. E.

Bittar, A.

Hamlin, J. D.

Hsia, J. J.

V. R. Weidner, J. J. Hsia, “Standard Reference Materials: Preparation and Calibration of First-Surface Aluminum Mirror Specular Reflectance Standards (Standard Reference Material 2003a),” Natl. Bur. Stand. U.S. Spec. Publ. 260-75 (May1982).

W. R. Weidner, J. J. Hsia, “NBS Specular Reflectometer–Spectrophotometer,” Appl. Opt. 19, 1268–1273 (1980).
[CrossRef] [PubMed]

Jacobson, M.

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

Koehler, W. F.

Krsek, J.

F. Petru, J. Krsek, “A Reflectometer for Measurements of Reflectivity of Dielectric Mirrors,” Opt. Acta 21, 293–314 (1974).
[CrossRef]

Morren, L.

L. Morren, “Quelques Observations Concernant la Mesure des Facteurs de Réfléction et de Trasmission,” Lux 134, 4–8 (1985).

Parks, R.

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

Petru, F.

F. Petru, J. Krsek, “A Reflectometer for Measurements of Reflectivity of Dielectric Mirrors,” Opt. Acta 21, 293–314 (1974).
[CrossRef]

Pettit, R. B.

R. B. Pettit, “Characterization of the Reflected Beam Profile of Solar Mirror Materials,” Sol. Energy 19, 733–741 (1977).
[CrossRef]

Rodgers, M.

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

Weidner, V. R.

V. R. Weidner, J. J. Hsia, “Standard Reference Materials: Preparation and Calibration of First-Surface Aluminum Mirror Specular Reflectance Standards (Standard Reference Material 2003a),” Natl. Bur. Stand. U.S. Spec. Publ. 260-75 (May1982).

Weidner, W. R.

Zander, K.

K. Zander, “Gerät zur Messung Des Gerichteten Specktralen Reflexionsgrades ebener Flächen bei Senkrechtem Strahlungseinfall,” Feinwerktech. Messtech. 85, 401–402 (1977).

Appl. Opt.

Feinwerktech. Messtech.

K. Zander, “Gerät zur Messung Des Gerichteten Specktralen Reflexionsgrades ebener Flächen bei Senkrechtem Strahlungseinfall,” Feinwerktech. Messtech. 85, 401–402 (1977).

J. Opt. Soc. Am.

Lux

L. Morren, “Quelques Observations Concernant la Mesure des Facteurs de Réfléction et de Trasmission,” Lux 134, 4–8 (1985).

Natl. Bur. Stand. U.S. Spec. Publ. 260-75

V. R. Weidner, J. J. Hsia, “Standard Reference Materials: Preparation and Calibration of First-Surface Aluminum Mirror Specular Reflectance Standards (Standard Reference Material 2003a),” Natl. Bur. Stand. U.S. Spec. Publ. 260-75 (May1982).

Opt. Acta

F. Petru, J. Krsek, “A Reflectometer for Measurements of Reflectivity of Dielectric Mirrors,” Opt. Acta 21, 293–314 (1974).
[CrossRef]

Opt. Eng.

K. Al-Marzouk, M. Jacobson, R. Parks, M. Rodgers, “New Absolute Reflectometer,” Opt. Eng. 21, 976–978 (1982).

Sol. Energy

R. B. Pettit, “Characterization of the Reflected Beam Profile of Solar Mirror Materials,” Sol. Energy 19, 733–741 (1977).
[CrossRef]

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Figures (5)

Fig. 1
Fig. 1

Working principles of the absolute reflectometer. Position I: recording of the 100% line; position II: sample positioning.

Fig. 2
Fig. 2

Optical arrangement of the instrument: S, source; Mc, monochromator; LC, collimating lens; P, polarizer; M1, auxiliary mirror; BS, beam splitter; M2, mirror for the reference beam; DL, limiting diaphragm; PM, photomultiplier; CH, chopper; PL, plotter and printer; and T1, T2, rotating platforms.

Fig. 3
Fig. 3

Optical alignment system: L, He–Ne laser; M1, auxiliary mirror (in position I or II when the sample is interposed); P1 and P2, 45° prisms; Rel, quadrant detector; and DL, limiting diaphragm.

Fig. 4
Fig. 4

Sample holder and its adjustments (rotation axes x,y,z and translation w).

Fig. 5
Fig. 5

Rectangular waves obtained at the detector output: (a) during the recording of the 100% line; and (b) during the measurement on the sample. Φ1, Φ2, ΦS, and φ1 have the meanings reported in the text, and T is the signal period.

Tables (4)

Tables Icon

Table I Mean Values and Root Mean Squares of Twenty Measurements Executed over a Month on the ZnSe Sample (s-Polarization)

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Table II Mean Values and Root Mean Squares of Twenty Measurements Executed over a Month on the ZnSe Sample (p-Polarization)

Tables Icon

Table III Measured Reflectance ρx and Comparison Reflectance ρc for the NIST Mirror (s-Polarization)

Tables Icon

Table IV Measured Reflectance ρx and Comparison Reflectance ρc for the NIST Mirror (p-Polarization)

Equations (3)

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Φ 1 = Φ 0 τ B S ρ M 1 ρ B S + Φ S , Φ 2 = Φ 0 ρ B S ρ M 2 τ B S + Φ S ,
φ 1 = Φ 0 τ BS ρ x ρ M 1 ρ x ρ B S + Φ S
ρ x = φ 1 / Φ 2 Φ 1 / Φ 2 .

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