Abstract

The first three significant digits of a sample’s refractive index are compensated by a standard, therefore a precise measurement, which is the same as the refractive index of the standard, can be obtained. The method only needs a thin sample.

© 1990 Optical Society of America

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References

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  1. F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, Rinehart & Winston, New York, 1961).
  2. F. Zernike, “Refractive Indices of Ammonium Dihydrogen Phosphate and Potassium Dihydrogen Phosphate Between 2000 Å and 1.5 μ,” J. Opt. Soc. Am. 54, 1215–1220 (1964); Errata 55, 210–211 (1965).
    [CrossRef]

1964 (1)

Bloss, F. D.

F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, Rinehart & Winston, New York, 1961).

Zernike, F.

J. Opt. Soc. Am. (1)

Other (1)

F. D. Bloss, An Introduction to the Methods of Optical Crystallography (Holt, Rinehart & Winston, New York, 1961).

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Figures (2)

Fig. 1
Fig. 1

Schematic representation of the refractive index measurement system: C, carriage; M1, beam splitter; M2,M3, mirrors; M4, beam combiner; S, slit.

Fig. 2
Fig. 2

Optical distance change caused by nonperpendicular incidence.

Equations (6)

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N = N 0 E 0 / E + K λ / L E ,
σ N N = [ ( N 0 E 0 N 0 E 0 L + K λ - 1 L ) 2 σ L 2 + ( N 0 L N 0 E 0 L + K λ - 1 E ) 2 σ E 2 + ( λ σ K N 0 E 0 L + K λ ) 2 ] 1 / 2 .
K ¯ = 14.00 , σ K = 0.01 , L ¯ = 24.383 mm , σ L = 0.005 mm , E ¯ = 1.7501 × 10 - 2 rad , σ E = 2.318 × 10 - 6 rad , E ¯ 0 = 1.7443 × 10 - 2 rad , σ E 0 = σ E .
N = 1.607639 + 3.62 × 10 - 4 ,
σ N / N = 2.9 × 10 - 13 + 1.5 × 10 - 12 + 1.8 × 10 - 16 .
[ ( d / cos θ - d ) n - ( d / cos θ - d ) ] / λ < ( d / cos θ - d ) n / λ = d n ( 1 / cos θ - 1 ) λ .

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