Abstract

A simplified method is presented for analyzing the optical characteristics of ridge MOS optical waveguides. Equations are derived for calculating the effective refractive indices and the absorption loss coefficients of the Epqx modes. The computations are performed for air–Au–air/SiO2/GaAs/AlGaAs ridge MOS waveguides. To achieve single-mode propagation with low absorption loss, appropriate selection of the structural parameters for this kind of waveguide is discussed.

© 1990 Optical Society of America

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