Abstract

Generally CCl4 is used in photothermal deflection spectroscopy as the deflecting medium. We looked for alternative deflecting liquids. This Letter reports the main features of some suitable liquids.

© 1990 Optical Society of America

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References

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  1. M. Montecchi, E. Masetti, G. Emiliani, “Measurement of Optical Absorptance in Multilayer Coatings by Photothermal Deflection Spectroscopy,” (submitted to Appl. Opt.291990).
    [PubMed]
  2. Transmittance as measured by a Perkin-Elmer Lambda 9 spectrophotometer filling a quartz cell (15 × 15 mm2) with the liquid.
  3. N. M. Amer, W. B. Jackson, Semiconductor and Semimetals, Vol. 21B, R. K. Williardson, A. C. Beer, Eds. (Academic, London, 1984).
  4. J. Stone, “Absorption of Light in Low-Loss Liquids,” J. Opt. Soc. Am. 62, 327–333 (1972).
    [CrossRef]
  5. American Institute of Physics Handbook, 3rd ed. (McGraw-Hill, New York, 1982).

1972 (1)

Amer, N. M.

N. M. Amer, W. B. Jackson, Semiconductor and Semimetals, Vol. 21B, R. K. Williardson, A. C. Beer, Eds. (Academic, London, 1984).

Emiliani, G.

M. Montecchi, E. Masetti, G. Emiliani, “Measurement of Optical Absorptance in Multilayer Coatings by Photothermal Deflection Spectroscopy,” (submitted to Appl. Opt.291990).
[PubMed]

Jackson, W. B.

N. M. Amer, W. B. Jackson, Semiconductor and Semimetals, Vol. 21B, R. K. Williardson, A. C. Beer, Eds. (Academic, London, 1984).

Masetti, E.

M. Montecchi, E. Masetti, G. Emiliani, “Measurement of Optical Absorptance in Multilayer Coatings by Photothermal Deflection Spectroscopy,” (submitted to Appl. Opt.291990).
[PubMed]

Montecchi, M.

M. Montecchi, E. Masetti, G. Emiliani, “Measurement of Optical Absorptance in Multilayer Coatings by Photothermal Deflection Spectroscopy,” (submitted to Appl. Opt.291990).
[PubMed]

Stone, J.

J. Opt. Soc. Am. (1)

Other (4)

American Institute of Physics Handbook, 3rd ed. (McGraw-Hill, New York, 1982).

M. Montecchi, E. Masetti, G. Emiliani, “Measurement of Optical Absorptance in Multilayer Coatings by Photothermal Deflection Spectroscopy,” (submitted to Appl. Opt.291990).
[PubMed]

Transmittance as measured by a Perkin-Elmer Lambda 9 spectrophotometer filling a quartz cell (15 × 15 mm2) with the liquid.

N. M. Amer, W. B. Jackson, Semiconductor and Semimetals, Vol. 21B, R. K. Williardson, A. C. Beer, Eds. (Academic, London, 1984).

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Tables (3)

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TABLE I Useful Optical Ranges of the Examined Deflecting Liquids

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TABLE II Main Physical Constants of the Considered Materials

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TABLE III Thermal Diffusivity and Relative Deflecting Power of the Examined Liquids

Equations (2)

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V ( t , z ) = R 0 exp ( - h z ) cos ( 2 π ν t - h z )
R 0 = [ Tr L ( 1 n d n d T ) / ( λ l + λ l λ s ρ s c s / ρ l c l ) ] A n I 0 , h = π ν / k l , k l = λ l / ( ρ l c l ) ,

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