Abstract

An alignment technique has been developed for coupling to optical modes in a waveguide using right angle prisms.

© 1990 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. R. Ulrich, R. Torge, “Measurement of Thin Film Parameters with a Prism Coupler,” Appl. Opt. 12, 2901–2908 (1973).
    [Crossref] [PubMed]
  2. J. S. Wei, W. D. Westwood, “A New Method for Determining Thin-Film Refractive Index and Thickness Using Guided Optical Waves,” Appl. Phys. Lett. 32, 819–821 (1978).
    [Crossref]
  3. C. W. Pitt et al., “R.F. Sputtered Thin Films for Integrated Optical Components,” Thin Solid Films 26, 25–51 (1975).
    [Crossref]
  4. H. P. Weber, F. A. Dunn, W. N. Leibolt, “Loss Measurements in Thin-Film Optical Waveguides,” Appl. Opt. 12, 755–757 (1973).
    [Crossref] [PubMed]
  5. Y. H. Won et al., “Three Prism Loss Measurement of Optical Waveguides,” Appl. Phys. Lett. 37, 269–271 (1980).
    [Crossref]
  6. E. A. Arutunyan, S. Kh. Galoyan, “New Method for Loss Measurements in Optical Waveguides,” Opt. Commun. 57, 391–393 (1986).
    [Crossref]
  7. B. L. Weiss, J. M. Naden, “Waveguide Attenuation Measurement Using a Prism Coupler,” Proc. Soc. Photo-Opt. Instrum. Eng. 835, 246–250 (1987).
  8. P. K. Tien, R. Ulrich, “Theory of Prism-Film Coupler and Thin-Film Light Guides,” J. Opt. Soc. Am. 60, 1325–1337 (1970).
    [Crossref]
  9. P. K. Tien, “Light Waves in Thin Films and Integrated Optics,” Appl. Opt. 10, 2395–2413 (1971).
    [Crossref] [PubMed]

1987 (1)

B. L. Weiss, J. M. Naden, “Waveguide Attenuation Measurement Using a Prism Coupler,” Proc. Soc. Photo-Opt. Instrum. Eng. 835, 246–250 (1987).

1986 (1)

E. A. Arutunyan, S. Kh. Galoyan, “New Method for Loss Measurements in Optical Waveguides,” Opt. Commun. 57, 391–393 (1986).
[Crossref]

1980 (1)

Y. H. Won et al., “Three Prism Loss Measurement of Optical Waveguides,” Appl. Phys. Lett. 37, 269–271 (1980).
[Crossref]

1978 (1)

J. S. Wei, W. D. Westwood, “A New Method for Determining Thin-Film Refractive Index and Thickness Using Guided Optical Waves,” Appl. Phys. Lett. 32, 819–821 (1978).
[Crossref]

1975 (1)

C. W. Pitt et al., “R.F. Sputtered Thin Films for Integrated Optical Components,” Thin Solid Films 26, 25–51 (1975).
[Crossref]

1973 (2)

1971 (1)

1970 (1)

Arutunyan, E. A.

E. A. Arutunyan, S. Kh. Galoyan, “New Method for Loss Measurements in Optical Waveguides,” Opt. Commun. 57, 391–393 (1986).
[Crossref]

Dunn, F. A.

Galoyan, S. Kh.

E. A. Arutunyan, S. Kh. Galoyan, “New Method for Loss Measurements in Optical Waveguides,” Opt. Commun. 57, 391–393 (1986).
[Crossref]

Leibolt, W. N.

Naden, J. M.

B. L. Weiss, J. M. Naden, “Waveguide Attenuation Measurement Using a Prism Coupler,” Proc. Soc. Photo-Opt. Instrum. Eng. 835, 246–250 (1987).

Pitt, C. W.

C. W. Pitt et al., “R.F. Sputtered Thin Films for Integrated Optical Components,” Thin Solid Films 26, 25–51 (1975).
[Crossref]

Tien, P. K.

Torge, R.

Ulrich, R.

Weber, H. P.

Wei, J. S.

J. S. Wei, W. D. Westwood, “A New Method for Determining Thin-Film Refractive Index and Thickness Using Guided Optical Waves,” Appl. Phys. Lett. 32, 819–821 (1978).
[Crossref]

Weiss, B. L.

B. L. Weiss, J. M. Naden, “Waveguide Attenuation Measurement Using a Prism Coupler,” Proc. Soc. Photo-Opt. Instrum. Eng. 835, 246–250 (1987).

Westwood, W. D.

J. S. Wei, W. D. Westwood, “A New Method for Determining Thin-Film Refractive Index and Thickness Using Guided Optical Waves,” Appl. Phys. Lett. 32, 819–821 (1978).
[Crossref]

Won, Y. H.

Y. H. Won et al., “Three Prism Loss Measurement of Optical Waveguides,” Appl. Phys. Lett. 37, 269–271 (1980).
[Crossref]

Appl. Opt. (3)

Appl. Phys. Lett. (2)

J. S. Wei, W. D. Westwood, “A New Method for Determining Thin-Film Refractive Index and Thickness Using Guided Optical Waves,” Appl. Phys. Lett. 32, 819–821 (1978).
[Crossref]

Y. H. Won et al., “Three Prism Loss Measurement of Optical Waveguides,” Appl. Phys. Lett. 37, 269–271 (1980).
[Crossref]

J. Opt. Soc. Am. (1)

Opt. Commun. (1)

E. A. Arutunyan, S. Kh. Galoyan, “New Method for Loss Measurements in Optical Waveguides,” Opt. Commun. 57, 391–393 (1986).
[Crossref]

Proc. Soc. Photo-Opt. Instrum. Eng. (1)

B. L. Weiss, J. M. Naden, “Waveguide Attenuation Measurement Using a Prism Coupler,” Proc. Soc. Photo-Opt. Instrum. Eng. 835, 246–250 (1987).

Thin Solid Films (1)

C. W. Pitt et al., “R.F. Sputtered Thin Films for Integrated Optical Components,” Thin Solid Films 26, 25–51 (1975).
[Crossref]

Cited By

OSA participates in Crossref's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (2)

Fig. 1
Fig. 1

Incident beam must strike the coupling surface first.

Fig. 2
Fig. 2

Two rays defining the beamwidth of incident radiation at the prism dihedral: (a) the base angle >90° and the rays diverge; (b) (base angle <90°) rays converge and cross. Reflected angles are shown for emphasis only not accuracy.

Metrics