Abstract

We present a method of determining optical constants n and k of a thin film using only the reflectance R(ω) curve (normal incidence reflectance spectroscopy). The method is based on the simultaneous use of Fresnel laws and dispersion relations between n and k of the film, via an iterative process. To illustrate the method, optical constants in the VUV of a film grown on InP were determined. A second example with a SnO2 film shows how the method can reduce the effect of experimental errors when two sets of spectroscopic data are available.

© 1990 Optical Society of America

Full Article  |  PDF Article
Related Articles
Determination of optical constants of thin film coating materials based on inverse synthesis

J. A. Dobrowolski, F. C. Ho, and A. Waldorf
Appl. Opt. 22(20) 3191-3200 (1983)

Unambiguous determination of optical constants of absorbing films by reflectance and transmittance measurements

Ross C. McPhedran, Lindsay C. Botten, David R. McKenzie, and Roger P. Netterfield
Appl. Opt. 23(8) 1197-1205 (1984)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (8)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Equations (13)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription