Abstract

A krypton ion laser was used to measure the spectral characteristics of a narrowband multilayer dielectric rejection filter produced by plasma chemical vapor deposition.

© 1990 Optical Society of America

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References

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  1. Lord Rayleigh, “On the Reflection of Light from a Regularly Stratified Medium,” Proc. R. Soc. London Ser. A 93, 492–503 (1917).
  2. P. Baumeister, “Theory of Rejection Filters with Ultranarrow Bandwidths,” J. Opt. Soc. Am. 71, 604–606 (1981).
    [CrossRef]

1981 (1)

1917 (1)

Lord Rayleigh, “On the Reflection of Light from a Regularly Stratified Medium,” Proc. R. Soc. London Ser. A 93, 492–503 (1917).

Baumeister, P.

Rayleigh, Lord

Lord Rayleigh, “On the Reflection of Light from a Regularly Stratified Medium,” Proc. R. Soc. London Ser. A 93, 492–503 (1917).

J. Opt. Soc. Am. (1)

Proc. R. Soc. London Ser. A (1)

Lord Rayleigh, “On the Reflection of Light from a Regularly Stratified Medium,” Proc. R. Soc. London Ser. A 93, 492–503 (1917).

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Figures (3)

Fig. 1
Fig. 1

Measured reflectance of a half-cylinder coated with the design air(HL)190 glass, where H and L represent layers of 165-nm optical thickness and refractive index of ~1.58. The refractive index of the H layer is ~3% higher than the L layer.

Fig. 2
Fig. 2

Transmittance of the half-cylinder captioned in Fig. 1 as measured on a Perkin-Elmer Lambda-9 spectrophotometer. The angles of incidence are: 0 (A), 10° (B), and 20° (C).

Fig. 3
Fig. 3

Measured spectral transmittance of the half-cylinder captioned in Fig. 1, as obtained from angle tuning through several laser lines. The solid squares represent measurements at 647.1 nm and the circles at 632.8 nm.

Equations (3)

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δ λ C θ 2
x ( 4 / T min ) 1 / 380
B W 4 π - 1 ( x - 1 ) ( x + 1 ) - 1 ,

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