Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Optical characterization of grating surface emitting semiconductor lasers

Not Accessible

Your library or personal account may give you access

Abstract

We describe an apparatus for measuring the optical characteristics of grating coupled surface emitting semiconductor lasers. These measurements include far and near field measurements, spectrum, and total power. The far field can be determined with an absolute accuracy of 0.01°.

© 1990 Optical Society of America

Full Article  |  PDF Article
More Like This
Lasing behavior of circular grating surface-emitting semiconductor lasers

Rebecca H. Jordan, Dennis G. Hall, Oliver King, Gary Wicks, and Stephen Rishton
J. Opt. Soc. Am. B 14(2) 449-453 (1997)

Near- and far-field characterization of diode lasers

Shimon Peled
Appl. Opt. 19(2) 324-328 (1980)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved