In this paper we present a fast method for the determination of dielectric permittivity ∊ = −∊r + i∊i and thickness d of metal layers from surface plasmon resonance reflection curves. The method is an iteration process using starting parameters derived directly from a reflection curve. The method is tested with simulations and is applied to experimental results. Accuracies reached for silver layers between 25–100 nm and gold layers between 40–75 nm are better than: ∊r ±1%; ∊i ±13% and d ±8%.
© 1990 Optical Society of America
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