Abstract

This paper describes how to predict the refractive-index profile in a field assisted ion-exchange process. Since the dielectric constant varies during the ion exchange, the field correction has been considered using the Lorentz–Lorenz formula. The index profile of a planar microlens is simulated by numerically solving a drift–diffusion equation for dopant ions in a glass and the result agrees well with the measured one.

© 1989 Optical Society of America

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