Abstract

The design and construction of a set of four high reflectance metal–dielectric thin film multilayers which produce phase changes on reflection that differ by 90° in the 0.55–0.77-μm spectral range are described. This provides the basis for a new type of optical Doppler Michelson imaging interferometer for use in upper atmospheric studies in which achromatic phase shifts are produced without mirror motions.

© 1989 Optical Society of America

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