Near millimeter wave characterization of dual mode materials

Michael Stead; George Simonis

doi:10.1364/AO.28.001874

Applied Optics
Vol. 28,
Issue 10,
pp. 1874-1876
(1989)
•https://doi.org/10.1364/AO.28.001874

Near millimeter wave characterization of dual mode materials

Michael Stead and George Simonis

Not Accessible

Your library or personal account may give you access

Get PDF
Email
Share
Get Citation
Copy Citation Text
Michael Stead and George Simonis, "Near millimeter wave characterization of dual mode materials," Appl. Opt. 28, 1874-1876 (1989)

Export Citation
- BibTex
- Endnote (RIS)
- HTML
- Plain Text
Citation alert
Save article

Abstract

Materials known to have useful properties in the IR were examined in the millimeter wave region. Their complex indices of refraction have been determined in the 90–550-GHz range. The method of determination was nondispersive Fourier transform spectroscopy. The instrument employed was a polarizing interferometer.

Full Article | PDF Article

More Like This

Submillimeter and millimeter wave characterization of absorbing materials

Hamid Hemmati, John C. Mather, and William L. Eichhorn
Appl. Opt. 24(24) 4489-4492 (1985)

Simple method for the determination of refractive indices and loss parameters for liquid-crystal materials in the millimeter-wave region

Toshiaki Nose, Michinori Honma, Tatsuo Nozokido, and Koji Mizuno
Appl. Opt. 44(7) 1150-1155 (2005)

Research on an artificial dielectric material for millimeter-wave imaging application

Jinbang Wang, Hanxue Mei, Kui Yang, Lu Zhao, Zhiguo Liu, and Tao Zhang
Appl. Opt. 56(7) 1947-1952 (2017)

Previous Article Next Article

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (1)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Material	Thickness (cm)	Delta t (cm)	Index for		Alpha (94 GHz)	Alpha (300 GHz)	Alpha (4 μm)	Tan (94 GHz)
Material	Thickness (cm)	Delta t (cm)	MMW	IR	Alpha (94 GHz)	Alpha (300 GHz)	Alpha (4 μm)	Tan (94 GHz)
Sapphire	5.0730	0.0010	3.06	1.68	0.03	0.11	0.03	0.0006
ALON	1.0867	0.0005	3.06	1.68	<0.05	0.11	0.131	0.0006
	0.2009	0.0006
Spinel	0.6313	0.0005	2.88	1.62	<0.05	0.22	0.048	0.0012
	0.3147	0.0011
Yttria	0.9840	0.0002	3.43	1.89	<0.05	0.21	<0.1^b	0.0010
	0.3245	0.0005
D:MgF₂	0.3474	0.0007	2.30	1.35	<0.05	0.17	<0.001	0.0011
F:MgF₂	0.3530	0.0006	2.30	1.35	<0.05	0.18	<0.001	0.0011
ZnSe	0.6622	0.0002	3.02	2.43	0.13	0.53	0.001	0.0028
	0.3589	0.0002
ZnS (normal)	0.6905	0.0003	2.89	2.25	0.13	0.58	<0.002	0.0032
	0.1486	0.0009
ZnS (ms)	0.7560	0.0003	2.90	2.25	<0.05	0.39	<0.002	0.0021
	0.4149	0.0012

Abstract

Cited By

Figures (5)

Tables (1)

Equations (1)

Applied Optics